Analysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulator

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage2973en_US
dc.citation.issueNumber19en_US
dc.citation.spage2973en_US
dc.citation.volumeNumber78en_US
dc.contributor.authorSahin, O.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2015-07-28T11:56:25Z
dc.date.available2015-07-28T11:56:25Z
dc.date.issued2001-05-07en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractWe present a mechanical model for the atomic force microscope tip tapping on a sample. The model treats the tip as a forced oscillator and the sample as an elasticmaterial with adhesiveproperties. It is possible to transform the model into an electrical circuit, which offers a way of simulating the problem with an electrical circuit simulator. Also, the model predicts the energy dissipation during the tip–sample interaction. We briefly discuss the model and give some simulation results to promote an understanding of energy dissipation in a tapping mode.en_US
dc.identifier.doi10.1063/1.1369614en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/10958
dc.language.isoEnglishen_US
dc.publisherAIP Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.1369614en_US
dc.source.titleApplied Physics Lettersen_US
dc.subjectEnergy-dissipationen_US
dc.titleAnalysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulatoren_US
dc.typeArticleen_US

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