Identifying the most valuable developers using artifact traceability graphs

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buir.contributor.authorÇetin, H. Alperen
dc.citation.epage1198en_US
dc.citation.spage1196en_US
dc.contributor.authorÇetin, H. Alperenen_US
dc.contributor.editorApel, S.
dc.contributor.editorDumas, M.
dc.contributor.editorRusso, A.
dc.contributor.editorPfahl, D.
dc.coverage.spatialTallin, Estoniaen_US
dc.date.accessioned2020-01-30T07:45:32Z
dc.date.available2020-01-30T07:45:32Z
dc.date.issued2019
dc.departmentDepartment of Computer Engineeringen_US
dc.descriptionDate of Conference: 26-30 August 2019en_US
dc.descriptionConference Name: 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2019en_US
dc.description.abstractFinding the most valuable and indispensable developers is a crucial task in software development. We categorize these valuable developers into two categories: connector and maven. A typical connector represents a developer who connects different groups of developers in a large-scale project. Mavens represent the developers who are the sole experts in specific modules of the project. To identify the connectors and mavens, we propose an approach using graph centrality metrics and connections of traceability graphs. We conducted a preliminary study on this approach by using two open source projects: QT 3D Studio and Android. Initial results show that the approach leads to identify the essential developers.en_US
dc.description.sponsorshipACM SIGSOFTen_US
dc.identifier.doi10.1145/3338906.3342487en_US
dc.identifier.isbn9781450355728en_US
dc.identifier.urihttp://hdl.handle.net/11693/52918en_US
dc.language.isoEnglishen_US
dc.publisherAssociation for Computing Machinery, Incen_US
dc.relation.isversionofhttps://dx.doi.org/10.1145/3338906.3342487en_US
dc.source.titleProceedings of the 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2019en_US
dc.subjectTraceabilityen_US
dc.subjectDeveloper categoriesen_US
dc.subjectSocial networksen_US
dc.subjectArtifact graphsen_US
dc.titleIdentifying the most valuable developers using artifact traceability graphsen_US
dc.typeConference Paperen_US

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