Electronic structure of strained Sin / Gen (001) superlattices

buir.contributor.authorÇıracı, Salim
buir.contributor.orcidÇıracı, Salim|0000-0001-8023-9860
dc.citation.epage1290en_US
dc.citation.issueNumber11en_US
dc.citation.spage1285en_US
dc.citation.volumeNumber65en_US
dc.contributor.authorÇıracı, Salimen_US
dc.contributor.authorGülseren, O.en_US
dc.contributor.authorEllialtioğlu, Ş.en_US
dc.date.accessioned2016-02-08T10:57:29Z
dc.date.available2016-02-08T10:57:29Z
dc.date.issued1988en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractUsing the empirical tight binding method we have investigated the electronic properties of the Sin/Gen(001) strained superlattices as a function of the superlattice periodicity and the band misfit. For n ≥ 4 we have found that first and second conduction band states are localized in Si. The hole states localized in Ge appear for n ≥ 4. The difference between the direct and indirect band gaps is reduced from 2.01 eV for bulk Si to 0.01 eV for n=6 which can be considered to be quasi-direct. For the cases n=6 and n=8, the band gap might become direct for large values of band misfit. © 1988.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:57:29Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 1988en
dc.identifier.doi10.1016/0038-1098(88)90078-6en_US
dc.identifier.issn0038-1098
dc.identifier.urihttp://hdl.handle.net/11693/26277
dc.language.isoEnglishen_US
dc.publisherPergamon Pressen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/0038-1098(88)90078-6en_US
dc.source.titleSolid State Communicationsen_US
dc.titleElectronic structure of strained Sin / Gen (001) superlatticesen_US
dc.typeArticleen_US

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