XPS characterization of Bi and Mn collected on atom-trapping silica for AAS

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buir.contributor.authorSüzer, Şefik
dc.citation.epage482en_US
dc.citation.issueNumber4en_US
dc.citation.spage479en_US
dc.citation.volumeNumber53en_US
dc.contributor.authorSüzer, Şefiken_US
dc.contributor.authorErtas, N.en_US
dc.contributor.authorAtaman, O. Y.en_US
dc.date.accessioned2016-02-08T10:42:25Z
dc.date.available2016-02-08T10:42:25Z
dc.date.issued1999en_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractThe chemical state of analyte species collected on a water-cooled silica tube during atom-trapping atomic absorption spectrometric determination is investigated with the use of X-ray photoelectron spectroscopy (XPS) for Bi and Mn. Analysis of the Bi 4f7/2 peak reveals that the chemical state of Bi is +3 during initial trapping (before the atomization stage), but an additional 0-valence state of Bi is also observed after the atomization stage. With the use of the measured Mn 2p3/2 binding energy together with the observed 3s multiplet splitting, the chemical state of Mn is determined as +2 in all stages. Together with our previous determination of 0 valence for Au, it is now postulated that the stability of certain valence states of the three elements (Au, Bi, and Mn) on the silica matrix can be correlated to their electrochemical reduction potentials.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:42:25Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 1999en
dc.identifier.doi10.1366/0003702991946776en_US
dc.identifier.issn0003-7028
dc.identifier.urihttp://hdl.handle.net/11693/25294
dc.language.isoEnglishen_US
dc.publisherSage Publications, Inc.en_US
dc.relation.isversionofhttps://doi.org/10.1366/0003702991946776en_US
dc.source.titleApplied Spectroscopyen_US
dc.subjectAbsorption spectroscopyen_US
dc.subjectAtomizationen_US
dc.subjectAtomsen_US
dc.subjectBismuthen_US
dc.subjectElectrochemistryen_US
dc.subjectHole trapsen_US
dc.subjectManganeseen_US
dc.subjectReductionen_US
dc.subjectSilicaen_US
dc.subjectAtom trappingen_US
dc.subjectElectrochemical reduction potentialsen_US
dc.subjectMultiplet splittingen_US
dc.subjectValence state determinationen_US
dc.subjectX ray photoelectron spectroscopyen_US
dc.titleXPS characterization of Bi and Mn collected on atom-trapping silica for AASen_US
dc.typeArticleen_US

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