Electron spectroscopy for material characterization

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buir.contributor.authorSüzer, Şefik
dc.citation.epage319en_US
dc.citation.issueNumber4en_US
dc.citation.spage309en_US
dc.citation.volumeNumber22en_US
dc.contributor.authorSüzer, Şefiken_US
dc.date.accessioned2016-02-08T10:43:41Z
dc.date.available2016-02-08T10:43:41Z
dc.date.issued1998en_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractBasic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.en_US
dc.identifier.issn1300-0527
dc.identifier.urihttp://hdl.handle.net/11693/25372
dc.language.isoEnglishen_US
dc.publisherTÜBİTAKen_US
dc.source.titleTurkish Journal of Chemistryen_US
dc.titleElectron spectroscopy for material characterizationen_US
dc.typeArticleen_US

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