Analysis of an arbitrary-profile, cylindrical, impedance reflector surface illuminated by an E-polarized complex line source beam

dc.citation.epage377en_US
dc.citation.issueNumber3en_US
dc.citation.spage360en_US
dc.citation.volumeNumber28en_US
dc.contributor.authorKuyucuoglu, F.en_US
dc.contributor.authorOǧuzer, T.en_US
dc.contributor.authorAvgin, I.en_US
dc.contributor.authorAltintas, A.en_US
dc.date.accessioned2016-02-08T11:00:15Z
dc.date.available2016-02-08T11:00:15Z
dc.date.issued2014en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractElectromagnetic scattering from a cylindrical reflector surface having an arbitrary conic section profile is studied. We assumed an electrically thin layer antenna illuminated by a complex line source in E-polarization mode. Our boundary value formulation, without loss of generality, involves an integral equation approach having impedance-type thin-layer boundary conditions. For simplicity, we also considered both faces of the reflector of the same uniform impedance value. Our computation employs the Method of Analytical Regularization (MAR) technique: the integral equations are converted into the discrete Fourier transform domain yielding two coupled dual series equations, which are then solved by the Fourier inversion and Riemann Hilbert Problem techniques. We demonstrate the accuracy and the convergence behaviors of our numerically solved MAR results that can serve as an accurate benchmark for comparison with widely used results obtained by approximate boundary conditions. © 2013 Taylor and Francis.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:00:15Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2014en
dc.identifier.doi10.1080/09205071.2013.870932en_US
dc.identifier.issn0920-5071
dc.identifier.urihttp://hdl.handle.net/11693/26469
dc.language.isoEnglishen_US
dc.publisherVSP BVen_US
dc.relation.isversionofhttp://dx.doi.org/10.1080/09205071.2013.870932en_US
dc.source.titleJournal of Electromagnetic Waves and Applicationsen_US
dc.subjectnumerical modelingen_US
dc.subjectreflector surfaceen_US
dc.subjectregularizationen_US
dc.subjectscatteringen_US
dc.subjectDielectric materialsen_US
dc.subjectDiscrete Fourier transformsen_US
dc.subjectIntegral equationsen_US
dc.subjectNumerical modelsen_US
dc.subjectScatteringen_US
dc.subjectApproximate boundary conditionen_US
dc.subjectCylindrical reflectorsen_US
dc.subjectElectromagnetic scatteringen_US
dc.subjectIntegral equation approachesen_US
dc.subjectMethod of analytical regularizationen_US
dc.subjectReflector surfacesen_US
dc.subjectregularizationen_US
dc.subjectRiemann Hilbert problemsen_US
dc.subjectBoundary conditionsen_US
dc.titleAnalysis of an arbitrary-profile, cylindrical, impedance reflector surface illuminated by an E-polarized complex line source beamen_US
dc.typeArticleen_US

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