Identification of insect damaged wheat kernels using transmittance images
buir.contributor.author | Çetin, A. Enis | |
buir.contributor.orcid | Çetin, A. Enis|0000-0002-3449-1958 | |
dc.citation.epage | 2920 | en_US |
dc.citation.spage | 2917 | en_US |
dc.citation.volumeNumber | 2 | en_US |
dc.contributor.author | Çataltepe, Z. | en_US |
dc.contributor.author | Çetin, A. Enis | en_US |
dc.contributor.author | Pearson, T. | en_US |
dc.coverage.spatial | Singapore, Singapore | en_US |
dc.date.accessioned | 2016-02-08T11:52:33Z | |
dc.date.available | 2016-02-08T11:52:33Z | |
dc.date.issued | 2004 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.description | Date of Conference: 24-27 October 2004 | en_US |
dc.description | Conference Name: International Conference on Image Processing, IEEE 2004 | en_US |
dc.description.abstract | We used transmittance images and different learning algorithms to classify insect damaged and un-damaged wheat kernels. Using the histogram of the pixels of the wheat images as the feature, and the linear model as the learning algorithm, we achieved a False Positive Rate (1-specificity) of 0.2 at the True Positive Rate (sensitivity) of 0.8 and an Area Under the ROC Curve (AUC) of 0.86. Combining the linear model and a Radial Basis Function Network in a committee resulted in a FP Rate of 0.1 at the TP Rate of 0.8 and an AUC of 0.92. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T11:52:33Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2004 | en |
dc.identifier.doi | 10.1109/ICIP.2004.1421723 | en_US |
dc.identifier.issn | 1522-4880 | en_US |
dc.identifier.uri | http://hdl.handle.net/11693/27406 | |
dc.language.iso | English | en_US |
dc.publisher | IEEE | en_US |
dc.relation.isversionof | https://doi.org/10.1109/ICIP.2004.1421723 | en_US |
dc.source.title | Proceedings of the International Conference on Image Processing, IEEE 2004 | en_US |
dc.subject | Image transmittance | en_US |
dc.subject | Kernels | en_US |
dc.subject | Pixel intensity | en_US |
dc.subject | Radial function networks | en_US |
dc.subject | Algorithms | en_US |
dc.subject | Computer simulation | en_US |
dc.subject | Markov processes | en_US |
dc.subject | Mathematical models | en_US |
dc.subject | Mobile telecommunication systems | en_US |
dc.subject | Robustness (control systems) | en_US |
dc.subject | Sensors | en_US |
dc.subject | Image processing | en_US |
dc.title | Identification of insect damaged wheat kernels using transmittance images | en_US |
dc.type | Conference Paper | en_US |