AlGaN/GaN HEMT-based fully monolithic X-band low noise amplifier

Date
2005-04
Authors
Schwindt, R.
Kumar, V.
Aktas, O.
Lee, J. W.
Adesida, I.
Advisor
Instructor
Source Title
Physica Status Solidi C
Print ISSN
1610-1634
Electronic ISSN
Publisher
Wiley
Volume
2
Issue
7
Pages
2631 - 2634
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Abstract

A fully monolithic AlGaN/GaN HEMT-based low noise amplifier is reported. The circuit demonstrated a noise figure of 3.5 dB, gain of -7.5 dB, input return loss of -7.5 dB, and output return loss of -15 dB at 8.5 GHz. The dc characteristics of individual 0.25-μm × 150-μm transistors were: maximum current density of 1.0 A/mm, maximum transconductance of 170 mS/mm and a threshold voltage of -6.8 V. The devices have a typical short circuit current gain cutoff frequency of 24.5 GHz and a maximum oscillating frequency of 48 GHz. The devices demonstrated a minimum noise figure of 1.6 dB with an associated gain of 10.6 dB at 10 GHz.

Course
Other identifiers
Book Title
Keywords
Aluminum nitride, Amplifiers (electronic), Current density, Gain measurement, Gallium nitride, Natural frequencies, Oscillations, Spurious signal noise, Threshold voltage, Transconductance, Input return loss, Low noise amplifier, Output return loss, High electron mobility transistors
Citation
Published Version (Please cite this version)