Substrate effects on electrical parameters of Dirac fermions in graphene
buir.contributor.author | Özbay, Ekmel | |
buir.contributor.author | Özbay, Ekmel | |
buir.contributor.orcid | Özbay, Ekmel|0000-0003-2953-1828 | |
dc.citation.epage | 7 | en_US |
dc.citation.spage | 1 | en_US |
dc.citation.volumeNumber | 133 | en_US |
dc.contributor.author | Tiras, E. | |
dc.contributor.author | Ardali, S. | |
dc.contributor.author | Firat, H. A. | |
dc.contributor.author | Arslan, E. | |
dc.contributor.author | Özbay, Ekmel | |
dc.date.accessioned | 2022-02-23T05:25:37Z | |
dc.date.available | 2022-02-23T05:25:37Z | |
dc.date.issued | 2021-05-19 | |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.department | Department of Physics | en_US |
dc.department | Nanotechnology Research Center (NANOTAM) | en_US |
dc.description.abstract | The substrate effects on the electronic transport properties of single-layer graphene on TiO2/Si substrate have been studied. The Hall mobility, sheet carrier density, and transport lifetime were obtained from the temperature-dependent Hall measurements, while the in-plane effective mass, quantum lifetime was obtained from the temperature-dependent variation of the Shubnikov de Haas (SdH) oscillations that were made at 1.8 to 45 K temperature range and up to the magnetic field of 11 T. The measurement results showed that in SLG/TiO2/Si sample, there were 2.36 ± 0.12x1016 m-3 amounts of 3D carriers coming from the substrate. In our previous studies, 3D carrier densities were measured as 6.07x1016 m-3 and zero for SLG/SiO2/Si and SLG/SiC sample, respectively. This result shows that the 3D carriers formed in the structure are significantly changed by a substrate. The scattering mechanisms were determined using the ratio. The ratio values obtained as 3.66. This value obtained was compared with the values we found for SLG/SiC (=1.36) sample and SLG/TiO2/Si (=3.08) sample our previous study. The results show that small-angle scattering is dominant in SLG/SiC sample, but large-angle scattering is dominant in SLG/SiO2/Si and SLG/TiO2/Si samples. The charged impurity scattering is the dominant scattering mechanism in SLG/TiO2/Si and SLG/SiO2/Si samples, whereas in SLG/SiC samples, a short-range scattering mechanism such as lattice defects can be said to affect the electronic transport. | en_US |
dc.embargo.release | 2023-05-19 | |
dc.identifier.doi | 10.1016/j.mssp.2021.105936 | en_US |
dc.identifier.eissn | 1873-4081 | |
dc.identifier.issn | 1369-8001 | |
dc.identifier.uri | http://hdl.handle.net/11693/77558 | |
dc.language.iso | English | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.isversionof | https://doi.org/10.1016/j.mssp.2021.105936 | en_US |
dc.source.title | Materials Science in Semiconductor Processing | en_US |
dc.subject | Graphene/Ti2O/Si | en_US |
dc.subject | Shubnikov de haas oscillations | en_US |
dc.subject | In-plane effective mass | en_US |
dc.title | Substrate effects on electrical parameters of Dirac fermions in graphene | en_US |
dc.type | Article | en_US |
relation.isAuthorOfPublication | 8c1d6866-696d-46a3-a77d-5da690629296 |
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