Substrate effects on electrical parameters of Dirac fermions in graphene

buir.contributor.authorÖzbay, Ekmel
buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage7en_US
dc.citation.spage1en_US
dc.citation.volumeNumber133en_US
dc.contributor.authorTiras, E.
dc.contributor.authorArdali, S.
dc.contributor.authorFirat, H. A.
dc.contributor.authorArslan, E.
dc.contributor.authorÖzbay, Ekmel
dc.date.accessioned2022-02-23T05:25:37Z
dc.date.available2022-02-23T05:25:37Z
dc.date.issued2021-05-19
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentDepartment of Physicsen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.description.abstractThe substrate effects on the electronic transport properties of single-layer graphene on TiO2/Si substrate have been studied. The Hall mobility, sheet carrier density, and transport lifetime were obtained from the temperature-dependent Hall measurements, while the in-plane effective mass, quantum lifetime was obtained from the temperature-dependent variation of the Shubnikov de Haas (SdH) oscillations that were made at 1.8 to 45 K temperature range and up to the magnetic field of 11 T. The measurement results showed that in SLG/TiO2/Si sample, there were 2.36 ± 0.12x1016 m-3 amounts of 3D carriers coming from the substrate. In our previous studies, 3D carrier densities were measured as 6.07x1016 m-3 and zero for SLG/SiO2/Si and SLG/SiC sample, respectively. This result shows that the 3D carriers formed in the structure are significantly changed by a substrate. The scattering mechanisms were determined using the ratio. The ratio values obtained as 3.66. This value obtained was compared with the values we found for SLG/SiC (=1.36) sample and SLG/TiO2/Si (=3.08) sample our previous study. The results show that small-angle scattering is dominant in SLG/SiC sample, but large-angle scattering is dominant in SLG/SiO2/Si and SLG/TiO2/Si samples. The charged impurity scattering is the dominant scattering mechanism in SLG/TiO2/Si and SLG/SiO2/Si samples, whereas in SLG/SiC samples, a short-range scattering mechanism such as lattice defects can be said to affect the electronic transport.en_US
dc.embargo.release2023-05-19
dc.identifier.doi10.1016/j.mssp.2021.105936en_US
dc.identifier.eissn1873-4081
dc.identifier.issn1369-8001
dc.identifier.urihttp://hdl.handle.net/11693/77558
dc.language.isoEnglishen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttps://doi.org/10.1016/j.mssp.2021.105936en_US
dc.source.titleMaterials Science in Semiconductor Processingen_US
dc.subjectGraphene/Ti2O/Sien_US
dc.subjectShubnikov de haas oscillationsen_US
dc.subjectIn-plane effective massen_US
dc.titleSubstrate effects on electrical parameters of Dirac fermions in grapheneen_US
dc.typeArticleen_US
relation.isAuthorOfPublication8c1d6866-696d-46a3-a77d-5da690629296

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