Stress effects in prism coupling measurements of thin polymer films

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buir.contributor.authorAydınlı, Atilla
dc.citation.epage345en_US
dc.citation.issueNumber2en_US
dc.citation.spage341en_US
dc.citation.volumeNumber80en_US
dc.contributor.authorAgan, S.en_US
dc.contributor.authorAy, F.en_US
dc.contributor.authorKocabas, A.en_US
dc.contributor.authorAydınlı, Atillaen_US
dc.date.accessioned2016-02-08T10:24:17Z
dc.date.available2016-02-08T10:24:17Z
dc.date.issued2005en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractDue to the increasingly important role of some polymers in optical waveguide technologies, precise measurement of their optical properties has become important. Typically, prism coupling to slab waveguides made of materials of interest is used to measure the relevant optical parameters. However, such measurements are often complicated by the softness of the polymer films when stress is applied to the prism to couple light into the waveguides. In this work, we have investigated the optical properties of three different polymers, polystyrene (PS), polymethyl-methacrylate (PMMA), and benzocyclobutane (BCB). For the first time, the dependence of the refractive index, film thickness, and birefringence on applied stress in these thin polymer films was determined by means of the prism coupling technique. Both symmetric trapezoid shaped and right-angle prisms were used to couple the light into the waveguides. It was found that trapezoid shaped prism coupling gives better results in these thin polymer films. The refractive index of PMMA was found to be in the range of 1.4869 up to 1.4876 for both TE and TM polarizations under the applied force, which causes a small decrease in the film thickness of up to 0.06 μm. PMMA waveguide films were found not to be birefringent. In contrast, both BCB and PS films exhibit birefringence albeit of opposing signs.en_US
dc.identifier.doi10.1007/s00339-003-2222-5en_US
dc.identifier.issn0947-8396
dc.identifier.urihttp://hdl.handle.net/11693/24112
dc.language.isoEnglishen_US
dc.publisherSpringeren_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s00339-003-2222-5en_US
dc.source.titleApplied Physics A: Materials Science and Processingen_US
dc.subjectBirefringenceen_US
dc.subjectDielectric filmsen_US
dc.subjectLight polarizationen_US
dc.subjectMicrometersen_US
dc.subjectOptical waveguidesen_US
dc.subjectPrismsen_US
dc.subjectRefractive indexen_US
dc.subjectStress analysisen_US
dc.subjectThin filmsen_US
dc.subjectOptical parametersen_US
dc.subjectPrism coupling measurementsen_US
dc.subjectStress effectsen_US
dc.subjectThin polymer filmsen_US
dc.subjectPolymethyl methacrylatesen_US
dc.titleStress effects in prism coupling measurements of thin polymer filmsen_US
dc.typeArticleen_US

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