Conductance through atomic contacts created by scanning tunneling microscopy

buir.contributor.authorÇıracı, Salim
buir.contributor.orcidÇıracı, Salim|0000-0001-8023-9860
dc.citation.epage343en_US
dc.citation.spage335en_US
dc.citation.volumeNumber98-99en_US
dc.contributor.authorKiliç, Ç.en_US
dc.contributor.authorMehrez, H.en_US
dc.contributor.authorÇıracı, Salimen_US
dc.contributor.authorBatra, I. P.en_US
dc.date.accessioned2016-02-08T10:42:25Z
dc.date.available2016-02-08T10:42:25Z
dc.date.issued1999en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractWe investigate conductance through contacts created by pressing a hard tip, as used in scanning tunneling microscopy, against substrates. Two different substrates are considered, one a normal metal (Cu) and another a semi-metal (graphite). Our study involves the molecular dynamics simulations for the atomic structure during the growth of the contact, and selfconsistent field electronic structure calculations of deformed bodies. We develop a theory predicting the conductance variations as the tip approaches the surface. We offer an explanation for a quasiperiodic variation of conductance of the contact on the graphite surface, a behavior which is dramatically different from contacts on normal metals.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:42:25Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 1999en
dc.identifier.issn0368-2048
dc.identifier.urihttp://hdl.handle.net/11693/25295
dc.language.isoEnglishen_US
dc.publisherElsevieren_US
dc.source.titleJournal of Electron Spectroscopy and Related Phenomenaen_US
dc.subjectAtomic contactsen_US
dc.subjectConductanceen_US
dc.subjectMolecular dynamics simulationsen_US
dc.titleConductance through atomic contacts created by scanning tunneling microscopyen_US
dc.typeArticleen_US

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