Noise enhanced detection in the restricted Bayesian framework

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buir.contributor.authorGezici, Sinan
dc.citation.epage3781en_US
dc.citation.spage3778en_US
dc.contributor.authorBayram, Suaten_US
dc.contributor.authorGezici, Sinanen_US
dc.contributor.authorPoor H.V.en_US
dc.coverage.spatialDallas, TX, USAen_US
dc.date.accessioned2016-02-08T12:23:08Z
dc.date.available2016-02-08T12:23:08Z
dc.date.issued2010en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 14-19 March 2010en_US
dc.description.abstractEffects of additive independent noise are investigated for sub-optimal detectors according to the restricted Bayes criterion. The statistics of optimal additive noise are characterized. Also, sufficient conditions for improvability or nonimprovability of detection via additive noise are obtained. A detection example is presented to study the theoretical results. ©2010 IEEE.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T12:23:08Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2010en
dc.identifier.doi10.1109/ICASSP.2010.5495847en_US
dc.identifier.issn1520-6149
dc.identifier.urihttp://hdl.handle.net/11693/28533
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ICASSP.2010.5495847en_US
dc.source.title2010 IEEE International Conference on Acoustics, Speech and Signal Processingen_US
dc.subjectStochastic resonanceen_US
dc.subjectDetectionen_US
dc.subjectMinimaxen_US
dc.subjectNoise-enhanced detectionen_US
dc.subjectRestricted Bayesen_US
dc.subjectStochastic resonancesen_US
dc.subjectAdditive noiseen_US
dc.subjectCircuit resonanceen_US
dc.subjectDetectorsen_US
dc.subjectMagnetic resonanceen_US
dc.subjectOptimizationen_US
dc.subjectSignal processingen_US
dc.subjectStochastic systemsen_US
dc.subjectSignal detectionen_US
dc.titleNoise enhanced detection in the restricted Bayesian frameworken_US
dc.typeConference Paperen_US

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