Anharmonicity in GaTe layered crystals

buir.contributor.authorAydınlı, Atilla
dc.citation.epage1309
dc.citation.issueNumber12
dc.citation.spage1303
dc.citation.volumeNumber37
dc.contributor.authorAydınlı, Atilla
dc.contributor.authorGasanly, N. M.
dc.contributor.authorUka, A.
dc.contributor.authorEfeoglu, H.
dc.date.accessioned2016-02-08T10:31:16Z
dc.date.available2016-02-08T10:31:16Z
dc.date.issued2002
dc.departmentDepartment of Physics
dc.description.abstractThe temperature dependencies (10-300 K) of seven Raman-active mode frequencies in layered semiconductor gallium telluride have been measured in the frequency range from 25 to 300 cm -1. Softening and broadening of the optical phonon lines are observed with increasing temperature. Comparison between the experimental data and theories of the shift of the phonon lines during heating of the crystal showed that the experimental dependencies can be explained by contributions from thermal expansion and lattice anharmonicity. Lattice anharmonicity is determined to be due to three-phonon processes.
dc.identifier.doi10.1002/crat.200290006
dc.identifier.issn0232-1300
dc.identifier.urihttp://hdl.handle.net/11693/24570
dc.language.isoEnglish
dc.publisherWiley-VCH Verlag GmbH & Co. KGaA
dc.relation.isversionofhttp://dx.doi.org/10.1002/crat.200290006
dc.source.titleCrystal Research and Technology
dc.subjectChalcogenides
dc.subjectOptical properties
dc.subjectRaman spectroscopy
dc.subjectSemiconductors
dc.subjectCrystal lattices
dc.subjectOptical properties
dc.subjectPhonons
dc.subjectRaman spectroscopy
dc.subjectSemiconducting gallium compounds
dc.subjectThermal expansion
dc.subjectX ray diffraction analysis
dc.subjectOptical phonons
dc.subjectSingle crystals
dc.titleAnharmonicity in GaTe layered crystals
dc.typeArticle

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