Influence of deposition conditions on charge-trapping based nonvolatile memories
buir.advisor | Okyay, Ali Kemal | |
dc.contributor.author | Ghauri, Muhammad Maiz | |
dc.date.accessioned | 2016-01-08T18:28:20Z | |
dc.date.available | 2016-01-08T18:28:20Z | |
dc.date.issued | 2014 | |
dc.description | Cataloged from PDF version of article. | en_US |
dc.description | Includes bibliographical references leaves 36-38. | en_US |
dc.description.statementofresponsibility | Ghauri, Muhammad Maiz | en_US |
dc.format.extent | x, 38 leaves, illustrations, graphics | en_US |
dc.identifier.uri | http://hdl.handle.net/11693/16000 | |
dc.language.iso | English | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject.lcc | TK7895.M4 G43 2014 | en_US |
dc.subject.lcsh | Nonvolatile random-access memory. | en_US |
dc.title | Influence of deposition conditions on charge-trapping based nonvolatile memories | en_US |
dc.type | Thesis | en_US |
thesis.degree.discipline | Electrical and Electronic Engineering | |
thesis.degree.grantor | Bilkent University | |
thesis.degree.level | Master's | |
thesis.degree.name | MS (Master of Science) |
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