Investigation of Si1-xGex alloy formation by using STM

buir.advisorAkgül, Mustafa
dc.contributor.authorOral, Ahmet
dc.date.accessioned2016-01-08T20:20:45Z
dc.date.available2016-01-08T20:20:45Z
dc.date.issued1994
dc.descriptionCataloged from PDF version of article.en_US
dc.descriptionIncludes bibliographical references leaves 104-112.en_US
dc.description.statementofresponsibilityOral, Ahmeten_US
dc.format.extentix, 113 leaves, illustrationsen_US
dc.identifier.urihttp://hdl.handle.net/11693/18598
dc.language.isoEnglishen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectMinimum Cost Perfect Matching Problemen_US
dc.subjectPrimal-dual Algorithmsen_US
dc.subjectBlossom Algorithmen_US
dc.subjectFibonacci Heapsen_US
dc.subject.lccQH212 .S35 1994en_US
dc.subject.lcshSurfaces (Physics)en_US
dc.subject.lcshScanning tunneling microscopy.en_US
dc.subject.lcshSilicon compounds.en_US
dc.subject.lcshThin films, multivariate.en_US
dc.subject.lcshEpitaxy.en_US
dc.titleInvestigation of Si1-xGex alloy formation by using STMen_US
dc.typeThesisen_US
thesis.degree.disciplinePhysics
thesis.degree.grantorBilkent University
thesis.degree.levelDoctoral
thesis.degree.namePh.D. (Doctor of Philosophy)

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