Synthetic TEC mapping with ordinary and universal kriging

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buir.contributor.authorArıkan, Orhan
buir.contributor.orcidArıkan, Orhan|0000-0002-3698-8888
dc.citation.epage43en_US
dc.citation.spage39en_US
dc.contributor.authorSayın, I.en_US
dc.contributor.authorArıkan, F.en_US
dc.contributor.authorArıkan, Orhanen_US
dc.coverage.spatialIstanbul, Turkey
dc.date.accessioned2016-02-08T11:39:51Z
dc.date.available2016-02-08T11:39:51Z
dc.date.issued2007-06en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 14-16 June 2007
dc.descriptionConference name: 3rd International Conference on Recent Advances in Space Technologies, RAST 2007
dc.description.abstractSpatiotemporal variations in the ionosphere affects the HF and satellite communications and navigation systems. Total Electron Content (TEC) is an important parameter since it can be used to analyze the spatial and temporal variability of the ionosphere. In this study, the performance of the two widely used Kriging algorithms, namely Ordinary Kriging (OrK) and Universal Kriging (UnK), is compared over the synthetic data set. In order to represent various ionospheric states, such as quiet and disturbed days, spatially correlated residual synthetic TEC data with different variances is generated and added to trend functions. Synthetic data sampled with various type of sampling patterns and for a wide range of sampling point numbers. It is observed that for small sampling numbers and with higher variability, OrK gives smaller errors. As the sample number increases, UnK errors decrease faster. For smaller variances in the synthetic surfaces, UnK gives better results. For increasing variance and decreasing range values, usually, the errors increase for both OrK and UnK. © 2007 IEEE.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:39:51Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2007en
dc.identifier.doi10.1109/RAST.2007.4284019en_US
dc.identifier.urihttp://hdl.handle.net/11693/26929
dc.language.isoEnglishen_US
dc.publisherIEEE
dc.relation.isversionofhttp://dx.doi.org/10.1109/RAST.2007.4284019en_US
dc.source.titleProceedings of the 3rd International Conference on Recent Advances in Space Technologies, RAST 2007en_US
dc.subjectAerospace industryen_US
dc.subjectErrorsen_US
dc.subjectFunction evaluationen_US
dc.subjectIonosphereen_US
dc.subjectIonospheric measurementen_US
dc.subjectSamplingen_US
dc.subjectSatellite communication systemsen_US
dc.subjectStatisticsen_US
dc.subjectTelecommunication systemsen_US
dc.subject(001) parameteren_US
dc.subject(min ,max ,+) functionsen_US
dc.subjectIn orderen_US
dc.subjectIncreasing varianceen_US
dc.subjectinternational conferencesen_US
dc.subjectKrigingen_US
dc.subjectOrdinary kriging (OK)en_US
dc.subjectSample numberen_US
dc.subjectSampling patternsen_US
dc.subjectSampling pointsen_US
dc.subjectSatellite communicationsen_US
dc.subjectSmall samplingen_US
dc.subjectSpace technology (ST)en_US
dc.subjectSpatial and temporal variabilityen_US
dc.subjectSpatially correlateden_US
dc.subjectSpatio-temporal variationsen_US
dc.subjectSynthetic dataen_US
dc.subjectSynthetic data setsen_US
dc.subjectSynthetic surfacesen_US
dc.subjectTotal electron content (TEC)en_US
dc.subjectUniversal krigingen_US
dc.subjectWide-rangeen_US
dc.subjectError analysisen_US
dc.titleSynthetic TEC mapping with ordinary and universal krigingen_US
dc.typeConference Paperen_US

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