Gate induced monolayer behavior in twisted bilayer black phosphorus
dc.citation.issueNumber | 3 | en_US |
dc.citation.volumeNumber | 4 | en_US |
dc.contributor.author | Sevik, C. | en_US |
dc.contributor.author | Wallbank, J. R. | en_US |
dc.contributor.author | Gülseren, O. | en_US |
dc.contributor.author | Peeters, F. M. | en_US |
dc.contributor.author | Çakir, D. | en_US |
dc.date.accessioned | 2018-04-12T11:04:37Z | |
dc.date.available | 2018-04-12T11:04:37Z | |
dc.date.issued | 2017 | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | Optical and electronic properties of black phosphorus strongly depend on the number of layers and type of stacking. Using first-principles calculations within the framework of density functional theory, we investigate the electronic properties of bilayer black phosphorus with an interlayer twist angle of 90°. These calculations are complemented with a simple k p model which is able to capture most of the low energy features and is valid for arbitrary twist angles. The electronic spectrum of 90° twisted bilayer black phosphorus is found to be x-y isotropic in contrast to the monolayer. However x-y anisotropy, and a partial return to monolayer-like behavior, particularly in the valence band, can be induced by an external out-of-plane electric field. Moreover, the preferred hole effective mass can be rotated by 90° simply by changing the direction of the applied electric field. In particular, a +0.4 (-0.4) V A-1 out-of-plane electric field results in a ~60% increase in the hole effective mass along the y (x) axis and enhances the m*y /m*x (m*x /m*y) ratio as much as by a factor of 40. Our DFT and k p simulations clearly indicate that the twist angle in combination with an appropriate gate voltage is a novel way to tune the electronic and optical properties of bilayer phosphorus and it gives us a new degree of freedom to engineer the properties of black phosphorus based devices. © 2017 IOP Publishing Ltd. | en_US |
dc.description.provenance | Made available in DSpace on 2018-04-12T11:04:37Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 179475 bytes, checksum: ea0bedeb05ac9ccfb983c327e155f0c2 (MD5) Previous issue date: 2017 | en |
dc.identifier.doi | 10.1088/2053-1583/aa80c4 | en_US |
dc.identifier.issn | 2053-1583 | |
dc.identifier.uri | http://hdl.handle.net/11693/37163 | |
dc.language.iso | English | en_US |
dc.publisher | IOP Publishing | en_US |
dc.relation.isversionof | https://doi.org/10.1088/2053-1583/aa80c4 | en_US |
dc.source.title | 2D Materials | en_US |
dc.subject | Black phosphorus | en_US |
dc.subject | Effective mass | en_US |
dc.subject | Electric field | en_US |
dc.subject | First principles calculations | en_US |
dc.subject | K.p | en_US |
dc.title | Gate induced monolayer behavior in twisted bilayer black phosphorus | en_US |
dc.type | Article | en_US |
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