Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback
Date
2006
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Source Title
Proceedings of the IEEE International Magnetics Conference, INTERMAG 2006
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Publisher
IEEE
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Pages
584
Language
English
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Abstract
Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The resultant SHPM can operate in variable temperature environment, 77-300 K.