An effective preconditioner based on schur complement reduction for integral-equation formulations of dielectric problems

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buir.contributor.authorGürel, Levent
dc.citation.epage4en_US
dc.citation.spage1en_US
dc.contributor.authorMalas, Tahiren_US
dc.contributor.authorGürel, Leventen_US
dc.coverage.spatialCharleston, SC, USA
dc.date.accessioned2016-02-08T12:27:17Z
dc.date.available2016-02-08T12:27:17Z
dc.date.issued2009en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentComputational Electromagnetics Research Center (BiLCEM)en_US
dc.descriptionDate of Conference: 1-5 June 2009
dc.descriptionConference name: 2009 IEEE Antennas and Propagation Society International Symposium
dc.description.abstractThe author consider effective preconditioning of recently proposed two integral-equation formulations for dielectrics; the combined tangential formulation (CTF) and the electric and magnetic current combined-field integral equation (JMCFIE). These two formulations are of utmost interest since CTF yields more accurate results and JMCFIE yields better-conditioned systems than other formulations.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T12:27:17Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2009en
dc.identifier.doi10.1109/APS.2009.5172341en_US
dc.identifier.urihttp://hdl.handle.net/11693/28691
dc.language.isoEnglishen_US
dc.publisherIEEE
dc.relation.isversionofhttp://dx.doi.org/10.1109/APS.2009.5172341en_US
dc.source.titleIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)en_US
dc.subjectDielectrics
dc.subjectApplication specific processors
dc.subjectSparse matrices
dc.subjectVectors
dc.subjectMLFMA
dc.subjectAcceleration
dc.subjectComputational electromagnetics
dc.subjectIntegral equations
dc.subjectLinear systems
dc.subjectSystem testing
dc.titleAn effective preconditioner based on schur complement reduction for integral-equation formulations of dielectric problemsen_US
dc.typeConference Paperen_US

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