Analytical expressions for the local-field corrections in double-layer electron systems
Date
1999
Authors
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Instructor
Source Title
Superlattices and Microstructures
Print ISSN
0749-6036
Electronic ISSN
Publisher
Academic Press
Volume
25
Issue
4
Pages
573 - 581
Language
English
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Abstract
We develop an extension of the sum-rule version of the Singwi, Tosi, Land, and Sjolander (STLS) scheme applied to a double-layer electron system. We present analytical expressions for the intralayer and interlayer static structure factors and corresponding local-field corrections which agree quite well with the full STLS calculations. Some applications of our basic results and further generalizations of our method are discussed.