Observation of negative refraction and negative phase velocity in left-handed metamaterials

buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage124102-3en_US
dc.citation.issueNumber12en_US
dc.citation.spage124102-1en_US
dc.citation.volumeNumber86en_US
dc.contributor.authorAydin, K.en_US
dc.contributor.authorGuven, K.en_US
dc.contributor.authorSoukoulis, C. M.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2015-07-28T11:57:33Z
dc.date.available2015-07-28T11:57:33Z
dc.date.issued2005en_US
dc.departmentDepartment of Physicsen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.description.abstractWe report the transmission characteristics of a two-dimensional (2D) composite metamaterial (CMM) structure in free space. At the frequencies where left-handed transmission takes place, we experimentally confirmed that the CMM structure has effective negative refractive index. Phase shift between consecutive numbers of layers of CMM is measured and phase velocity is shown to be negative at the relevant frequency range. Refractive index values obtained from the refraction experiments and the phase measurements are in good agreement.en_US
dc.description.provenanceMade available in DSpace on 2015-07-28T11:57:33Z (GMT). No. of bitstreams: 1 10.1063-1.1888051.pdf: 717630 bytes, checksum: 59cd4767df0104e7c2d2df5ab1671ff4 (MD5)en
dc.identifier.doi10.1063/1.1888051en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/11394
dc.language.isoEnglishen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.1888051en_US
dc.source.titleApplied Physics Lettersen_US
dc.subjectCrystal Latticesen_US
dc.subjectElectric Impedanceen_US
dc.subjectLight Refractionen_US
dc.subjectMagnetic Resonanceen_US
dc.subjectMicrowavesen_US
dc.subjectPermittivityen_US
dc.subjectRefractive Indexen_US
dc.titleObservation of negative refraction and negative phase velocity in left-handed metamaterialsen_US
dc.typeArticleen_US

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