Phase retrieval from electric field intensity for wide angle optical fields
dc.contributor.author | Külçe, Onur | en_US |
dc.contributor.author | Onural, Levent | en_US |
dc.coverage.spatial | San Francisco, California, United States | en_US |
dc.date.accessioned | 2018-04-12T11:43:34Z | en_US |
dc.date.available | 2018-04-12T11:43:34Z | en_US |
dc.date.issued | 2017 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.description | Date of Conference: 26–29 June 2017 | en_US |
dc.description | Conference Name: OSA Imaging and Applied Optics Congress, AIO/IS 2017 | en_US |
dc.description.abstract | An intensity preserving scalar to vector electric field mapping, in a wave propagation environment, based on a filtering procedure is proposed. In a phase retrieval problem, the proposed mapping outperforms the conventional mapping. | en_US |
dc.description.provenance | Made available in DSpace on 2018-04-12T11:43:34Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 179475 bytes, checksum: ea0bedeb05ac9ccfb983c327e155f0c2 (MD5) Previous issue date: 2017 | en |
dc.identifier.doi | 10.1364/COSI.2017.CTu1B.4 | en_US |
dc.identifier.uri | http://hdl.handle.net/11693/37548 | en_US |
dc.language.iso | English | en_US |
dc.publisher | OSA | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1364/COSI.2017.CTu1B.4 | en_US |
dc.source.title | Proceedings of the Imaging and Applied Optics Congress, 2017 | en_US |
dc.subject | Mapping | en_US |
dc.subject | Wave propagation | en_US |
dc.subject | Conventional mapping | en_US |
dc.subject | Electric field intensities | en_US |
dc.subject | Electric field mapping | en_US |
dc.subject | Filtering procedures | en_US |
dc.subject | Optical field | en_US |
dc.subject | Phase retrieval | en_US |
dc.subject | Propagation environment | en_US |
dc.subject | Wide angle | en_US |
dc.subject | Electric fields | en_US |
dc.title | Phase retrieval from electric field intensity for wide angle optical fields | en_US |
dc.type | Conference Paper | en_US |
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