Low dark current diffusion limited planar type InGaAs photodetectors

buir.contributor.authorDolaş, M. Halit
buir.contributor.authorAteşal, Okan
buir.contributor.authorÇalışkan, M. Deniz
buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage6en_US
dc.citation.spage1en_US
dc.citation.volumeNumber11129en_US
dc.contributor.authorDolaş, M. Haliten_US
dc.contributor.authorAteşal, Okanen_US
dc.contributor.authorÇalışkan, M. Denizen_US
dc.contributor.authorBek, A.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.contributor.editorLeVan, P. D.
dc.contributor.editorWijewarnasuriya, P.
dc.contributor.editorSood, A. K.
dc.coverage.spatialSan Diego, California, United Statesen_US
dc.date.accessioned2020-01-30T11:03:22Z
dc.date.available2020-01-30T11:03:22Z
dc.date.issued2019
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.descriptionDate of Conference: 11-15 August 2019en_US
dc.descriptionConference Name: SPIE Optical Engineering and Applications, 2019en_US
dc.description.abstractIn this work, we design and produce 1280x1024 format InGaAs based planar type detectors with 15μm pixel pitch. We have obtained diffusion current limited low dark current (~10fA) and high responsivity (1.08A/W at 1.55μm) values at room temperature conditions. Moreover, dark current modeling is performed using diffusion, generation and recombination (GR) and trap assisted tunneling (TAT) current mechanisms. Ideality factor is extracted from forward bias characteristics. Excellent match between modeling and experimental data is reached. Also, temperature dependency of dark current is studied in 10°C – 60°C ranges. The area and perimeter related dark current components are differentiated using test detectors with changing diameters that are placed next to the detector array structure. Experimental data shows good agreement with theoretical expectations.en_US
dc.description.provenanceSubmitted by Zeynep Aykut (zeynepay@bilkent.edu.tr) on 2020-01-30T11:03:22Z No. of bitstreams: 1 Low_dark_current_diffusion_limited_planar_type_InGaAs_photodetectors.pdf: 952920 bytes, checksum: fd7c2275128738a9171854a4bccd55cc (MD5)en
dc.description.provenanceMade available in DSpace on 2020-01-30T11:03:22Z (GMT). No. of bitstreams: 1 Low_dark_current_diffusion_limited_planar_type_InGaAs_photodetectors.pdf: 952920 bytes, checksum: fd7c2275128738a9171854a4bccd55cc (MD5) Previous issue date: 2019en
dc.description.sponsorshipThe Society of Photo-Optical Instrumentation Engineers (SPIE)en_US
dc.identifier.doi10.1117/12.2528666en_US
dc.identifier.isbn9781510629516
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/11693/52929
dc.language.isoEnglishen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttps://dx.doi.org/10.1117/12.2528666en_US
dc.source.titleProceedings of SPIE Vol. 11129, Infrared Sensors, Devices, and Applications IXen_US
dc.subjectSWIRen_US
dc.subjectInGaAsen_US
dc.subjectPlanar p-n diodesen_US
dc.subjectLow dark currenten_US
dc.subjectMegapixelen_US
dc.titleLow dark current diffusion limited planar type InGaAs photodetectorsen_US
dc.typeConference Paperen_US

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