Room-temperature scanning Hall probe microscope (RT-SHPM) imaging of garnet films using new high-performance InSb sensors

dc.citation.epage2440en_US
dc.citation.issueNumber5en_US
dc.citation.spage2438en_US
dc.citation.volumeNumber38en_US
dc.contributor.authorOral, Ahmeten_US
dc.contributor.authorKaval, Muraten_US
dc.contributor.authorDede, Müniren_US
dc.contributor.authorMasuda, H.en_US
dc.contributor.authorOkamoto, A.en_US
dc.contributor.authorShibasaki, I.en_US
dc.contributor.authorSandhu, A.en_US
dc.coverage.spatialAmsterdam, Netherlandsen_US
dc.date.accessioned2016-02-08T11:56:46Zen_US
dc.date.available2016-02-08T11:56:46Zen_US
dc.date.issued2002en_US
dc.departmentDepartment of Physicsen_US
dc.descriptionDate of Conference: 28 April-2 May 2002en_US
dc.descriptionConference Name: 2002 International Magnetics Conference, INTERMAG 2002en_US
dc.description.abstractThe room-temperature scanning Hall probe microscopy (RT-SHPM) imaging of garnet films using high-performance InSb sensors was discussed. The high-performance InSb micro-Hall sensors were fabricated by optical lithography. It was found that the room-temperature noise figure of the InSb sensors was 6-10 mG/√Hz, which was an order of magnitude better than GaAs-AlGaAs two-dimensional electron gas sensors.en_US
dc.identifier.doi10.1109/TMAG.2002.803607en_US
dc.identifier.issn0018-9464en_US
dc.identifier.urihttp://hdl.handle.net/11693/27568en_US
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TMAG.2002.803607en_US
dc.source.titleIEEE Transactions on Magneticsen_US
dc.subjectHall effecten_US
dc.subjectScanning Hall probe microscopyen_US
dc.subjectCrystalline materialsen_US
dc.subjectElectron gasen_US
dc.subjectGarnetsen_US
dc.subjectImaging techniquesen_US
dc.subjectIndium compoundsen_US
dc.subjectPhotolithographyen_US
dc.subjectSensorsen_US
dc.subjectMagnetic filmsen_US
dc.titleRoom-temperature scanning Hall probe microscope (RT-SHPM) imaging of garnet films using new high-performance InSb sensorsen_US
dc.typeConference Paperen_US
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