Characterization of photonic crystals at microwave frequencies

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buir.advisorÖzbay, Ekmel
dc.contributor.authorTemelkuran, Burak
dc.date.accessioned2016-01-08T20:18:59Z
dc.date.available2016-01-08T20:18:59Z
dc.date.issued1996
dc.descriptionAnkara : Department of Physics and Institute of Engineering and Science, Bilkent Univ., 1996.en_US
dc.descriptionThesis(Master's) -- Bilkent University, 1996.en_US
dc.descriptionIncludes bibliographical references.en_US
dc.description.abstractVVe investigated the surface reflection properties of layer-by-layer photonic crystals, for dielectric and metallic based photonic crystals. By using a FabryPerot cavity analogy with the reflection-phase information of the photonic crystals, we predicted defect frequencies of planar defect structures. Our predictions were in good agreement with the measured defect frequencies. The Fabry-Perot cavity analogy was also used to relate the quality factors of the planar defect structures to the transmission of the mirrors of the cavity. A simple model was used to simulate the transmission spectra of planar defect structures, which agreed well with the experimental data. We also investigated the transmission and reflection properties of two different metallic crystal structures (face-centeredtetragonal and simple tetragonal). We obtained rejection rates of 7-8 dB per layer from metallic crystals. Defect modes created by removing rods resulted in high peak transmission (80%), and high quality factors (1740). Our measurements were in good agreement with theoretical simulations of metallic structures. Planar defect structures built around metallic structures resulted in higher quality factors (2250). We observed high reflection-rejection ratios (-80 dB) at defect frequencies for planar defect structures, which was explained by using the Fabry-Perot analogy. Finally, the enhanced field inside the defect volume was measured, by using a monopole receiver antenna inserted inside the defect. The maximum observed enhancement with respect to the incident field was around 200 for a planar defect structure. By placing a Schottky diode detector inside planar and box-like defects, we built resonant cavity enhanced (RCE) detectors and measured the enhanced field inside the defect.en_US
dc.description.provenanceMade available in DSpace on 2016-01-08T20:18:59Z (GMT). No. of bitstreams: 1 1.pdf: 78510 bytes, checksum: d85492f20c2362aa2bcf4aad49380397 (MD5)en
dc.description.statementofresponsibilityTemelkuran, Buraken_US
dc.format.extent65 leavesen_US
dc.identifier.urihttp://hdl.handle.net/11693/18404
dc.language.isoEnglishen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectPhotonic Crystalsen_US
dc.subjectReflection-Phase Measurementen_US
dc.subjectResonant Detectoren_US
dc.subjectMetallic Photonic Crystalen_US
dc.subjectSchottky Diode Detectoren_US
dc.subjectOptical Field Enhancementen_US
dc.subjectQuality Factoren_US
dc.subjectLocalized Defectsen_US
dc.subjectPlanar Defectsen_US
dc.subjectFabry-Perot Cavityen_US
dc.subject.lccQC793.5.P427 T46 1996en_US
dc.subject.lcshPhotons.en_US
dc.subject.lcshCrystals optics.en_US
dc.subject.lcshFabry-perot cavity.en_US
dc.titleCharacterization of photonic crystals at microwave frequenciesen_US
dc.typeThesisen_US
thesis.degree.disciplinePhysics
thesis.degree.grantorBilkent University
thesis.degree.levelMaster's
thesis.degree.nameMS (Master of Science)

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