Structural and electronic properties of MoS2, WS2, and WS2/MoS2 heterostructures encapsulated with hexagonal boron nitride monolayers
dc.citation.issueNumber | 6 | en_US |
dc.citation.volumeNumber | 122 | en_US |
dc.contributor.author | Yelgel, C. | en_US |
dc.contributor.author | Yelgel, Ö. C. | en_US |
dc.contributor.author | Gülseren, O. | en_US |
dc.date.accessioned | 2018-04-12T11:06:22Z | |
dc.date.available | 2018-04-12T11:06:22Z | |
dc.date.issued | 2017 | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | In this study, we investigate the structural and electronic properties of MoS2, WS2, and WS2/MoS2 structures encapsulated within hexagonal boron nitride (h-BN) monolayers with first-principles calculations based on density functional theory by using the recently developed non-local van der Waals density functional (rvv10). We find that the heterostructures are thermodynamically stable with the interlayer distance ranging from 3.425 Å to 3.625 Å implying van der Waals type interaction between the layers. Except for the WS2/h-BN heterostructure which exhibits direct band gap character with the value of 1.920 eV at the K point, all proposed heterostructures show indirect band gap behavior from the valence band maximum at the Γ point to the conduction band minimum at the K point with values varying from 0.907 eV to 1.710 eV. More importantly, it is found that h-BN is an excellent candidate for the protection of intrinsic properties of MoS2, WS2, and WS2/MoS2 structures. | en_US |
dc.description.provenance | Made available in DSpace on 2018-04-12T11:06:22Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 179475 bytes, checksum: ea0bedeb05ac9ccfb983c327e155f0c2 (MD5) Previous issue date: 2017 | en |
dc.identifier.doi | 10.1063/1.4998522 | en_US |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | http://hdl.handle.net/11693/37220 | |
dc.language.iso | English | en_US |
dc.publisher | American Institute of Physics Inc. | en_US |
dc.relation.isversionof | https://doi.org/10.1063/1.4998522 | en_US |
dc.source.title | Journal of Applied Physics | en_US |
dc.subject | Boron nitride | en_US |
dc.subject | Calculations | en_US |
dc.subject | Electronic properties | en_US |
dc.subject | Energy gap | en_US |
dc.subject | Heterojunctions | en_US |
dc.subject | Monolayers | en_US |
dc.subject | Nitrides | en_US |
dc.subject | Van der Waals forces | en_US |
dc.subject | Conduction-band minimum | en_US |
dc.subject | First-principles calculation | en_US |
dc.subject | Hexagonal boron nitride | en_US |
dc.subject | Hexagonal boron nitride (h-BN) | en_US |
dc.subject | Interlayer distance | en_US |
dc.subject | Structural and electronic properties | en_US |
dc.subject | Thermodynamically stable | en_US |
dc.subject | Valence-band maximums | en_US |
dc.subject | Density functional theory | en_US |
dc.title | Structural and electronic properties of MoS2, WS2, and WS2/MoS2 heterostructures encapsulated with hexagonal boron nitride monolayers | en_US |
dc.type | Article | en_US |
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