Analysis of design parameters in SIL-4 safety-critical computer

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dc.citation.epage8en_US
dc.citation.spage1en_US
dc.contributor.authorAhangari, Hamzehen_US
dc.contributor.authorÖzkök, Y. I.en_US
dc.contributor.authorYıldırım, A.en_US
dc.contributor.authorSay, F.en_US
dc.contributor.authorAtik, Fundaen_US
dc.contributor.authorÖztürk, Özcanen_US
dc.coverage.spatialOrlando, FL, USA
dc.date.accessioned2018-04-12T11:45:34Z
dc.date.available2018-04-12T11:45:34Z
dc.date.issued2017-01en_US
dc.departmentDepartment of Computer Engineeringen_US
dc.descriptionDate of Conference: 23-26 Jan. 2017
dc.descriptionConference name: 2017 Annual Reliability and Maintainability Symposium (RAMS)
dc.description.abstractNowadays, Safety-critical computers are extensively used in may civil domains like transportation including railways, avionics and automotive. We noticed that in design of some previous works, some critical safety design parameters like failure diagnostic coverage (DC) or common cause failure (CCF) ratio have not been seriously taken into account. Moreover, in some cases safety has not been compared with standard safety levels (IEC-61508 SIL1-SIL4) or even have not met them. Most often, it is not very clear that which part of the system is the Achilles' heel and how design can be improved to reach standard safety levels. Motivated by such design ambiguities, we aim to study the effect of various design parameters on safety in some prevalent safety configurations: 1oo2 and 2oo3. 1oo1 is also used as a reference. By employing Markov modeling, sensitivity of safety to each of the following critical design parameters is analyzed: failure rate of processing element, failure diagnostics coverage, common cause failures and repair rates. This study gives a deeper sense regarding influence of variation in design parameters over safety. Consequently, to meet appropriate safety integrity level, instead of improving some system parts blindly, it will be possible to make an informed decision on more relevant parameters. © 2017 IEEE.en_US
dc.identifier.doi10.1109/RAM.2017.7889787en_US
dc.identifier.urihttp://hdl.handle.net/11693/37611
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/RAM.2017.7889787en_US
dc.source.titleProceedings - Annual Reliability and Maintainability Symposiumen_US
dc.subjectIEC 61508en_US
dc.subjectMarkov modelingen_US
dc.subjectSafetyen_US
dc.subjectSafety-critical computer systemen_US
dc.subjectAccident preventionen_US
dc.subjectFailure analysisen_US
dc.subjectMaintainabilityen_US
dc.subjectSystems analysisen_US
dc.subjectCommon cause failureen_US
dc.subjectCritical design parametersen_US
dc.subjectFailure diagnosticsen_US
dc.subjectInformed decisionen_US
dc.subjectMarkov modelen_US
dc.subjectProcessing elementsen_US
dc.subjectSafety integrity levelsen_US
dc.subjectSafety engineeringen_US
dc.titleAnalysis of design parameters in SIL-4 safety-critical computeren_US
dc.typeConference Paperen_US

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