Direct magnetic imaging of ferromagnetic domain structures by room temperature scanning hall probe microscopy using a bismuth micro-Hall probe

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dc.citation.epageL527en_US
dc.citation.issueNumber5Ben_US
dc.citation.spageL524en_US
dc.citation.volumeNumber40en_US
dc.contributor.authorSandhu, A.en_US
dc.contributor.authorMasuda, H.en_US
dc.contributor.authorOral, A.en_US
dc.contributor.authorBending, S. J.en_US
dc.date.accessioned2016-02-08T10:35:25Z
dc.date.available2016-02-08T10:35:25Z
dc.date.issued2001en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractA bismuth micro-Hall probe sensor with an integrated scanning tunnelling microscope tip was incorporated into a room temperature scanning Hall probe microscope system and successfully used for the direct magnetic imaging of microscopic domains of low coercivity perpendicular garnet thin films and demagnetized strontium ferrite permanent magnets. At a driving current of 800 μA, the Hall coefficient, magnetic field sensitivity and spatial resolution of the Bi probe were 3.3 × 10-4 Ω/G, 0.38 G/√Hz and ∼ 2.8 μm, respectively. The room temperature magnetic field sensitivity of the Bi probe was comparable to that of a semiconducting 1.2μm GaAs/AlGaAs heterostructure micro-Hall probe, which exhibited a value of 0.41 G/√Hz at a maximum driving current of 2μA.en_US
dc.identifier.issn0021-4922
dc.identifier.urihttp://hdl.handle.net/11693/24862
dc.language.isoEnglishen_US
dc.publisherJapan Society of Applied Physicsen_US
dc.source.titleJapanese Journal of Applied Physics, Part 2: Lettersen_US
dc.subjectBismuthen_US
dc.subjectFerromagnetic domainsen_US
dc.subjectGarnetsen_US
dc.subjectHall probesen_US
dc.subjectPermanent magnetsen_US
dc.subjectScanning hall probe microscopyen_US
dc.subjectCoercive forceen_US
dc.subjectDemagnetizationen_US
dc.subjectGarnetsen_US
dc.subjectHall effecten_US
dc.subjectMagnetic field effectsen_US
dc.subjectPermanent magnetsen_US
dc.subjectScanning tunneling microscopyen_US
dc.subjectSemiconducting aluminum compoundsen_US
dc.subjectSemiconducting gallium arsenideen_US
dc.subjectSensorsen_US
dc.subjectStrontium compoundsen_US
dc.subjectThin filmsen_US
dc.subjectMagnetic imagingen_US
dc.subjectScanning hall probe microsscope systemen_US
dc.subjectFerromagnetic materialsen_US
dc.titleDirect magnetic imaging of ferromagnetic domain structures by room temperature scanning hall probe microscopy using a bismuth micro-Hall probeen_US
dc.typeArticleen_US

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