Micro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study

buir.contributor.authorKasap, Deniz
dc.citation.epage5en_US
dc.citation.spage1
dc.contributor.authorKasap, Deniz
dc.contributor.authorCarpegna, A.
dc.contributor.authorSavino, A.
dc.contributor.authorDi Carlo, S.
dc.coverage.spatialVenice, Italy
dc.date.accessioned2024-03-13T11:10:01Z
dc.date.available2024-03-13T11:10:01Z
dc.date.issued2023-07-12
dc.departmentDepartment of Electrical and Electronics Engineering
dc.descriptionConference Name: 2023 28th IEEE European Test Symposium (ETS)
dc.descriptionDate of Conference: 22-26 May 2023
dc.description.abstractRadiation-induced soft errors are one of the most challenging issues in Safety Critical Real-Time Embedded System (SACRES) reliability, usually handled using different flavors of Double Modular Redundancy (DMR) techniques. This solution is becoming unaffordable due to the complexity of modern micro-processors in all domains. This paper addresses the promising field of using Artificial Intelligence (AI) based hardware detectors for soft errors. To create such cores and make them general enough to work with different software applications, micro-Architectural attributes are a fascinating option as candidate fault detection features. Several processors already track these features through dedicated Performance Monitoring Unit (PMU). However, there is an open question to understand to what extent they are enough to detect faulty executions. Exploiting the capability of gem5 to simulate real computing systems, perform fault injection experiments, and profile micro-Architectural attributes (i.e., gem5 Stats), this paper presents the results of a comprehensive analysis regarding the potential attributes to detect soft errors and the associated models that can be trained with these features.
dc.description.provenanceMade available in DSpace on 2024-03-13T11:10:01Z (GMT). No. of bitstreams: 1 Micro-Architectural_features_as_soft-error_markers_in_embedded_safety-critical_systems_Preliminary_study.pdf: 3063955 bytes, checksum: 6bafe653eef9ae3c22a455702c1e534e (MD5) Previous issue date: 2023-05-22en
dc.identifier.doi10.1109/ETS56758.2023.10174219
dc.identifier.eisbn979-8-3503-3634-4
dc.identifier.eissn1558-1780
dc.identifier.isbn979-8-3503-3635-1
dc.identifier.isbn979-8-3503-3633-7
dc.identifier.issn1530-1877
dc.identifier.urihttps://hdl.handle.net/11693/114682
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.isversionofhttps://dx.doi.org/10.1109/ETS56758.2023.10174219
dc.source.title2023 IEEE European Test Symposium (ETS)
dc.subjectArtificial neural networks
dc.subjectMachine learning
dc.subjectReliability
dc.subjectSoft error analysis
dc.subjectSoft errors
dc.titleMicro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study
dc.typeConference Paper

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