Femtosecond laser crystallization of amorphous Ge
Date
2011
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Abstract
Ultrafast crystallization of amorphous germanium (a-Ge) in ambient has been studied. Plasma enhanced chemical vapor deposition grown a-Ge was irradiated with single femtosecond laser pulses of various durations with a range of fluences from below melting to above ablation threshold. Extensive use of Raman scattering has been employed to determine post solidification features aided by scanning electron microscopy and atomic force microscopy measurements. Linewidth of the Ge optic phonon at 300 cm -1 as a function of laser fluence provides a signature for the crystallization of a-Ge. Various crystallization regimes including nanostructures in the form of nanospheres have been identified.
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Journal of Applied Physics
Publisher
American Institute of Physics
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Keywords
Ablation thresholds, Amorphous germanium, Femto-second laser, Fluences, Laser fluences, Optic phonon, Ultra-fast, Atomic force microscopy, Chemical vapor deposition, Crystallization, Nanospheres, Plasma deposition, Plasma enhanced chemical vapor deposition, Scanning electron microscopy, Ultrafast lasers, Ultrashort pulses, Germanium
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English