Effect of tip profile on atomic-force microscope images: a model study
| buir.contributor.author | Çıracı, Salim | |
| buir.contributor.orcid | Çıracı, Salim|0000-0001-8023-9860 | |
| dc.citation.epage | 1317 | en_US |
| dc.citation.issueNumber | 13 | en_US |
| dc.citation.spage | 1314 | en_US |
| dc.citation.volumeNumber | 60 | en_US |
| dc.contributor.author | Abraham, F. F. | en_US |
| dc.contributor.author | Batra, I. P. | en_US |
| dc.contributor.author | Çıracı, Salim | en_US |
| dc.date.accessioned | 2016-02-08T10:57:23Z | |
| dc.date.available | 2016-02-08T10:57:23Z | |
| dc.date.issued | 1988 | en_US |
| dc.department | Department of Physics | en_US |
| dc.description.abstract | Adopting the empirical silicon interatomic potential of Stillinger and Weber, we investigate the effect of the tip profile on the atomic-force microscope images for a prototype system, Si(001)-(2×1), and conclude that the tip profile has a profound effect on the observations. We also study relaxation of the surface under the influence of the tip using a many-body energy minimization procedure and find that the force exerted by the tip should be less than 10-9 N for the atomic-force microscope to be a nondestructive tool. © 1988 The American Physical Society. | en_US |
| dc.description.provenance | Made available in DSpace on 2016-02-08T10:57:23Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 1988 | en |
| dc.identifier.doi | 10.1103/PhysRevLett.60.1314 | en_US |
| dc.identifier.issn | 0031-9007 | |
| dc.identifier.uri | http://hdl.handle.net/11693/26269 | |
| dc.language.iso | English | en_US |
| dc.publisher | American Physical Society | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevLett.60.1314 | en_US |
| dc.source.title | Physical Review Letters | en_US |
| dc.title | Effect of tip profile on atomic-force microscope images: a model study | en_US |
| dc.type | Article | en_US |
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