Integral equation based method for the fast analysis of irregularly contoured large finite phased arrays

A fast and accurate integral equation based hybrid method that can investigate electrically large, arbitrarily contoured finite planar arrays of printed elements is developed. The method is a hybridization of the Galerkin type method of moments (MoM) and generalized forward backward method (GFBM) with the grounded dielectric slab's Green's function; and the acceleration of the resultant hybrid method by a discrete Fourier transform (DFT) based acceleration algorithm. Numerical results in the form of array current distribution are given for arbitrarily contoured as well as thinned arrays of probe fed microstrip patches where current on each element expanded by more than one subsectional basis function.