Forces and torques on the nanoscale: from measurement to applications
dc.citation.epage | 10 | en_US |
dc.citation.spage | 1 | en_US |
dc.citation.volumeNumber | 8458 | en_US |
dc.contributor.author | Volpe,Giovanni | en_US |
dc.coverage.spatial | San Diego, California, United States | en_US |
dc.date.accessioned | 2016-02-08T12:11:47Z | en_US |
dc.date.available | 2016-02-08T12:11:47Z | en_US |
dc.date.issued | 2012 | en_US |
dc.department | Department of Physics | en_US |
dc.description | Date of Conference: 12-16 August 2012 | en_US |
dc.description | Conference Name: SPIE NanoScience Engineering, 2012 | en_US |
dc.description.abstract | The possibility of measuring microscopic forces down to the femtonewton range has opened new possibilities in fields such as biophysics and nanophotonics. I will review some of the techniques most often employed, namely the photonic force microscope (PFM) and the total internal reflection microscope (TIRM), which are able to measure tiny forces acting on optically trapped particles. I will then discuss several applications of such nanoscopic forces: from plasmonic optical manipulation, to self-propelled microswimmers, to self-organization in large ensembles of particles. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T12:11:47Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2012 | en |
dc.identifier.doi | 10.1117/12.929409 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/11693/28124 | en_US |
dc.language.iso | English | en_US |
dc.publisher | SPIE | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1117/12.929409 | en_US |
dc.source.title | Proceedings of SPIE Vol. 8458, Optical Trapping and Optical Micromanipulation IX | en_US |
dc.subject | Brownian motion | en_US |
dc.subject | Force | en_US |
dc.subject | Nanoscience | en_US |
dc.subject | Optical tweezers | en_US |
dc.subject | Photonic force microscope | en_US |
dc.subject | Plasmonics | en_US |
dc.subject | Torque | en_US |
dc.subject | Total internal reflection microscopy | en_US |
dc.title | Forces and torques on the nanoscale: from measurement to applications | en_US |
dc.type | Conference Paper | en_US |
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