Forces and torques on the nanoscale: from measurement to applications

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dc.citation.epage10en_US
dc.citation.spage1en_US
dc.citation.volumeNumber8458en_US
dc.contributor.authorVolpe,Giovannien_US
dc.coverage.spatialSan Diego, California, United Statesen_US
dc.date.accessioned2016-02-08T12:11:47Zen_US
dc.date.available2016-02-08T12:11:47Zen_US
dc.date.issued2012en_US
dc.departmentDepartment of Physicsen_US
dc.descriptionDate of Conference: 12-16 August 2012en_US
dc.descriptionConference Name: SPIE NanoScience Engineering, 2012en_US
dc.description.abstractThe possibility of measuring microscopic forces down to the femtonewton range has opened new possibilities in fields such as biophysics and nanophotonics. I will review some of the techniques most often employed, namely the photonic force microscope (PFM) and the total internal reflection microscope (TIRM), which are able to measure tiny forces acting on optically trapped particles. I will then discuss several applications of such nanoscopic forces: from plasmonic optical manipulation, to self-propelled microswimmers, to self-organization in large ensembles of particles.en_US
dc.identifier.doi10.1117/12.929409en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11693/28124en_US
dc.language.isoEnglishen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.929409en_US
dc.source.titleProceedings of SPIE Vol. 8458, Optical Trapping and Optical Micromanipulation IXen_US
dc.subjectBrownian motionen_US
dc.subjectForceen_US
dc.subjectNanoscienceen_US
dc.subjectOptical tweezersen_US
dc.subjectPhotonic force microscopeen_US
dc.subjectPlasmonicsen_US
dc.subjectTorqueen_US
dc.subjectTotal internal reflection microscopyen_US
dc.titleForces and torques on the nanoscale: from measurement to applicationsen_US
dc.typeConference Paperen_US

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