Atomic-scale tip-sample interactions and contact phenomena

buir.contributor.authorÇıracı, Salim
buir.contributor.orcidÇıracı, Salim|0000-0001-8023-9860
dc.citation.epage21en_US
dc.citation.issueNumberPART 1en_US
dc.citation.spage16en_US
dc.citation.volumeNumber42-44en_US
dc.contributor.authorÇıracı, Salimen_US
dc.date.accessioned2016-02-08T10:55:46Z
dc.date.available2016-02-08T10:55:46Z
dc.date.issued1992en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractTip-sample interactions become crucial owing to increased overlap at small tip-sample separation. The potential barrier collapses before the point of maximum attraction on the apex of the tip, but the effective barrier may remain significant owing to the strong confinement of current-carrying states to the constriction between tip and sample. At such separations the perpendicular tip force is still attractive and determined by ion-ion repulsion and redistribution of electronic charge. Electronic states are modified by the tip-induced perturbation of the potential in the vicinity of the tip. Self-consistent calculations reveal that local properties, such as elastic deformation, effective height and width of the tunneling barrier, electronic states and attractive tip force are site-dependent and reversible on the atomic scale. Numerical results suggest a relation between the perpendicular tip force and barrier height as a function of separation. A mechanical contact is formed with relatively strong bonds at separation near the point of zero force gradient. Whether the effective potential can collapse and hence the first channel can open to allow a transition from tunneling to ballistic conduction, and whether the conductance can show quantized steplike changes with increasing plastic deformation depends on material properties. © 1992.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:55:46Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 1992en
dc.identifier.doi10.1016/0304-3991(92)90241-Ben_US
dc.identifier.issn0304-3991
dc.identifier.urihttp://hdl.handle.net/11693/26152
dc.language.isoEnglishen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/0304-3991(92)90241-Ben_US
dc.source.titleUltramicroscopyen_US
dc.subjectCalculationsen_US
dc.subjectElectron Energy Levelsen_US
dc.subjectElectronic Propertiesen_US
dc.subjectSpecimen Preparationen_US
dc.subjectContact Phenomenaen_US
dc.subjectScanning Tunneling Microscopyen_US
dc.subjectTip-Sample Separationen_US
dc.subjectTunneling Barrieren_US
dc.subjectMicroscopic Examinationen_US
dc.subjectconference paperen_US
dc.subjectmicroscopyen_US
dc.subjectscanning tunneling microscopyen_US
dc.titleAtomic-scale tip-sample interactions and contact phenomenaen_US
dc.typeArticleen_US

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