Charge retention in quantized energy levels of nanocrystals

Date

2007

Authors

Dâna, A.
Akça, I.
Ergun, O.
Aydınlı, Atilla
Turan, R.
Finstad, T. G.

Editor(s)

Advisor

Supervisor

Co-Advisor

Co-Supervisor

Instructor

BUIR Usage Stats
3
views
20
downloads

Series

Abstract

Understanding charging mechanisms and charge retention dynamics of nanocrystal (NC) memory devices is important in optimization of device design. Capacitance spectroscopy on PECVD grown germanium NCs embedded in a silicon oxide matrix was performed. Dynamic measurements of discharge dynamics are carried out. Charge decay is modelled by assuming storage of carriers in the ground states of NCs and that the decay is dominated by direct tunnelling. Discharge rates are calculated using the theoretical model for different NC sizes and densities and are compared with experimental data. Experimental results agree well with the proposed model and suggest that charge is indeed stored in the quantized energy levels of the NCs.

Source Title

Physica E : Low-Dimensional Systems and Nanostructures

Publisher

Elsevier B.V.

Course

Other identifiers

Book Title

Keywords

Carrier storage, Charge retention, Nanocrystals, Capacitance, Data storage equipment, Ground state, Mathematical models, Optimization, Plasma enhanced chemical vapor deposition, Capacitance spectroscopy, Carrier storages, Charge retention, Quantized energy levels, Nanocrystals

Degree Discipline

Degree Level

Degree Name

Citation

Published Version (Please cite this version)

Language

English

Type

Article