Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2x1)
| dc.citation.epage | 472 | en_US |
| dc.citation.issueNumber | 12 | en_US |
| dc.citation.spage | 469 | en_US |
| dc.citation.volumeNumber | 124 | en_US |
| dc.contributor.author | Özer, H. Ö. | en_US |
| dc.contributor.author | Atabak, M. | en_US |
| dc.contributor.author | Oral, A. | en_US |
| dc.date.accessioned | 2015-07-28T11:57:05Z | |
| dc.date.available | 2015-07-28T11:57:05Z | |
| dc.date.issued | 2002-12 | en_US |
| dc.department | Department of Physics | en_US |
| dc.description.abstract | Si(100)(2 x 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Angstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. (C) 2002 Elsevier Science Ltd. All rights reserved. | en_US |
| dc.description.provenance | Made available in DSpace on 2015-07-28T11:57:05Z (GMT). No. of bitstreams: 1 10.1016-S0038-1098(02)00547-1.pdf: 497870 bytes, checksum: af99c56816550700d0e3a85dc0309cfe (MD5) | en |
| dc.identifier.doi | 10.1016/S0038-1098(02)00547-1 | en_US |
| dc.identifier.issn | 0038-1098 | |
| dc.identifier.uri | http://hdl.handle.net/11693/11206 | |
| dc.institute | Si (100) surface, nc-AFM/STM studies | en_US |
| dc.language.iso | English | en_US |
| dc.publisher | Elsevier | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1016/S0038-1098(02)00547-1 | en_US |
| dc.source.title | Solid State Communications | en_US |
| dc.subject | Si (100) Surface | en_US |
| dc.subject | Nc-afm/stm Studies | en_US |
| dc.title | Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2x1) | en_US |
| dc.type | Article | en_US |
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