Charging/discharging dynamics of CdS and CdSe films under photoillumination using dynamic x-ray photoelectron spectroscopy

Date
2010
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Print ISSN
0734-2101
Electronic ISSN
1944-2807
Publisher
A I P Publishing LLC
Volume
28
Issue
4
Pages
639 - 642
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Series
Abstract

Thin films of CdS and CdSe are deposited on HF-cleaned Si O2 /Si substrates containing ∼5 nm thermally grown silicon oxide. x-ray photoelectron spectroscopy (XPS) data of these films are collected in a dynamic mode, which is based on recording the spectrum under modulation with an electrical signal in the form of ±10 V square-wave pulses. Accordingly, all peaks are twined and shifted with respect to the grounded spectrum. The binding energy difference between the twinned peaks of a dielectric system has a strong dependence on the frequency of the electrical stimuli. Therefore, dynamic XPS provides a means to extract additional properties of dielectric materials, such as effective resistance and capacitance. In this work, the authors report a new advancement to the previous method, where they now probe a photodynamic process. For this reason, photoillumination is introduced as an additional form of stimulus and used to investigate the combined optical and electrical response of the photoconductive thin films of CdS and CdSe using dynamic XPS.

Course
Other identifiers
Book Title
Keywords
CdS, CdSe films, Charging/discharging, Dielectric systems, Dynamic modes, Electrical response, Electrical signal, Electrical stimuli, Photodynamic process, Photoillumination, Si substrates, Square-wave, XPS, Binding energy, Cadmium alloys, Cadmium compounds, Cadmium sulfide, Data storage equipment, Dielectric materials, Dynamic response, Materials properties, Photoelectricity, Photoionization, Photons, Silicon compounds, Silicon oxides, Thin films, X ray photoelectron spectroscopy
Citation
Published Version (Please cite this version)