Probing dynamics of surface structures using x-ray photoelectron spectroscopy

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buir.contributor.authorSüzer, Şefik
dc.citation.epage9en_US
dc.citation.issueNumber3en_US
dc.citation.spage1en_US
dc.citation.volumeNumber2en_US
dc.contributor.authorSezen, H.en_US
dc.contributor.authorSüzer, Şefiken_US
dc.date.accessioned2019-02-14T08:27:36Z
dc.date.available2019-02-14T08:27:36Z
dc.date.issued2012en_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractBy incorporating laser illumination, and/or by application of electrical square-wave pulses to the sample, X-ray photoelectron spectroscopy is utilized to probe the dynamics of the surface structures in the range of 10-3 to 105 Hz. Different experimental methodologies are introduced, and their applications to investigate certain dynamical properties of two compound semiconductors, CdS and GaN are given. It is shown that dynamics of charging/discharging and surface photovoltage formation and its dissipation, and entanglement of various processes can be investigated by following the voltage shifts recorded in a chemical specific fashion.en_US
dc.identifier.issn2249-2704 (print)en_US
dc.identifier.issn2249-2712 (online)en_US
dc.identifier.urihttp://hdl.handle.net/11693/49507
dc.language.isoEnglishen_US
dc.publisherSimplex Academicen_US
dc.source.titleJournal of Spectroscopy and Dynamicsen_US
dc.subjectCharging/Discharging Dynamicsen_US
dc.subjectSurface photovoltageen_US
dc.subjectPhotoconductivityen_US
dc.subjectXPSen_US
dc.titleProbing dynamics of surface structures using x-ray photoelectron spectroscopyen_US
dc.typeArticleen_US

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