Subwavelength resolution with a negative-index metamaterial superlens

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buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage254102-1en_US
dc.citation.issueNumber25en_US
dc.citation.spage254102-3en_US
dc.citation.volumeNumber90en_US
dc.contributor.authorAydin, K.en_US
dc.contributor.authorBulu, I.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.date.accessioned2016-02-08T10:13:31Z
dc.date.available2016-02-08T10:13:31Z
dc.date.issued2007en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.description.abstractNegative-index metamaterials are candidates for imaging objects with sizes smaller than a half-wavelength. The authors report an impedance-matched, low loss negative-index metamaterial superlens that is capable of resolving subwavelength features of a point source with a 0.13λ. resolution, which is the highest resolution achieved by a negative-index metamaterial. By separating two point sources with a distance of λ/8, they were able to detect two distinct peaks on the image plane. They also showed that the metamaterial based structure has a flat lens behavior.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:13:31Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2007en
dc.identifier.doi10.1063/1.2750393en_US
dc.identifier.eissn1077-3118
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/23407
dc.language.isoEnglishen_US
dc.publisherAIP Publishing LLCen_US
dc.relation.isversionofhttps://doi.org/10.1063/1.2750393en_US
dc.source.titleApplied Physics Lettersen_US
dc.titleSubwavelength resolution with a negative-index metamaterial superlensen_US
dc.typeArticleen_US

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