Novel perspectives for the application of total internal reflection microscopy

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buir.contributor.authorVolpe, Giovanni
dc.citation.epage23985en_US
dc.citation.issueNumber26en_US
dc.citation.spage23975en_US
dc.citation.volumeNumber17en_US
dc.contributor.authorVolpe, Giovannien_US
dc.contributor.authorBrettschneider, T.en_US
dc.contributor.authorHelden, L.en_US
dc.contributor.authorBechinger, C.en_US
dc.date.accessioned2020-04-07T13:22:26Z
dc.date.available2020-04-07T13:22:26Z
dc.date.issued2009-12
dc.departmentDepartment of Physicsen_US
dc.departmentAdvanced Research Laboratories (ARL)en_US
dc.description.abstractTotal Internal Reflection Microscopy (TIRM) is a sensitive non-invasive technique to measure the interaction potentials between a colloidal particle and a wall with femtonewton resolution. The equilibrium distribution of the particle-wall separation distance z is sampled monitoring the intensity I scattered by the Brownian particle under evanescent illumination. Central to the data analysis is the knowledge of the relation between I and the corresponding z, which typically must be known a priori. This poses considerable constraints to the experimental conditions where TIRM can be applied (short penetration depth of the evanescent wave, transparent surfaces). Here, we introduce a method to experimentally determine I(z) by relying only on the distance-dependent particle-wall hydrodynamic interactions. We demonstrate that this method largely extends the range of conditions accessible with TIRM, and even allows measurements on highly reflecting gold surfaces where multiple reflections lead to a complex I(z).en_US
dc.description.provenanceSubmitted by Evrim Ergin (eergin@bilkent.edu.tr) on 2020-04-07T13:22:26Z No. of bitstreams: 1 Novel_perspectives_for_the_application_of_total_internal_reflection_microscopy.pdf: 327600 bytes, checksum: ee42dd9f8e0f564287deaba7bbb8591d (MD5)en
dc.description.provenanceMade available in DSpace on 2020-04-07T13:22:26Z (GMT). No. of bitstreams: 1 Novel_perspectives_for_the_application_of_total_internal_reflection_microscopy.pdf: 327600 bytes, checksum: ee42dd9f8e0f564287deaba7bbb8591d (MD5) Previous issue date: 2009-12en
dc.identifier.doi10.1364/OE.17.023975en_US
dc.identifier.eissn1094-4087
dc.identifier.urihttp://hdl.handle.net/11693/53560
dc.language.isoEnglishen_US
dc.publisherOptical Society of Americaen_US
dc.relation.isversionofhttps://doi.org/10.1364/OE.17.023975en_US
dc.source.titleOptics Expressen_US
dc.titleNovel perspectives for the application of total internal reflection microscopyen_US
dc.typeArticleen_US

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