Analytic thermal modeling for dc-to-midrange modulation frequency responses of thin-film high-Tc superconductive edge-transition bolometers

dc.citation.epage1088en_US
dc.citation.issueNumber7en_US
dc.citation.spage1080en_US
dc.citation.volumeNumber40en_US
dc.contributor.authorFardmanesh, M.en_US
dc.date.accessioned2016-02-08T10:35:49Z
dc.date.available2016-02-08T10:35:49Z
dc.date.issued2001en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractThin-film superconductive edge-transition bolometers are modeled with a one-dimensional analytic thermal model with joule heating, film and substrate materials, and the physical interface effects taken into consideration. The results from the model agree well with the experimental results of samples made of large-meander-line Yba2Cu3O7-x films on crystalline SrTiO3, LaAlO3, and MgO substrates up to 100 kHz, the limits of the experimental setup. Compared with the results of the SrTiO3 substrate samples, the results from the model of the LaAlO3 and the MgO substrate samples deviate slightly from the measured values at very low modulation frequencies (below ∼10 Hz). The deviation increases for higher thermal-conductive substrate materials. When the model was used, the substrate absorption and the thermal parameters of the devices could also be investigated. © 2001 Optical Society of America.en_US
dc.identifier.issn0003-6935
dc.identifier.urihttp://hdl.handle.net/11693/24892
dc.language.isoEnglishen_US
dc.publisherOptical Society of Americaen_US
dc.source.titleApplied Opticsen_US
dc.subjectJoule heatingen_US
dc.subjectComputer simulationen_US
dc.subjectCrystalline materialsen_US
dc.subjectFrequency modulationen_US
dc.subjectInterfaces (materials)en_US
dc.subjectThin filmsen_US
dc.subjectBolometersen_US
dc.titleAnalytic thermal modeling for dc-to-midrange modulation frequency responses of thin-film high-Tc superconductive edge-transition bolometersen_US
dc.typeArticleen_US

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