CeOx/Al2O3 thin films on stainless steel substrate-dynamical X-ray photoelectron spectroscopy investigations

Date
2013
Advisor
Instructor
Source Title
Thin Solid Films
Print ISSN
0040-6090
Electronic ISSN
1879-2731
Publisher
Elsevier
Volume
536
Issue
Pages
63 - 67
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Abstract

The CeOx/Al2O3 thin films on stainless steel with different ceria loading were subjected to a.c. (square wave) pulses at various frequencies in the range 10- 3 to 100 kHz while recording X-ray photoelectron spectra. The resulting binding energy differences were derived from the frequency dependence of the corresponding Al2p, Ce3d and O1s peaks. At low ceria loadings the main constituent on the surface is CeAlO 3 phase, while for high ceria loading the film is constructed from CeO2 and CeAlO3 phases spread over the Al 2O3. Accordingly, it was observed that the ceria loading determines the conductivities of the investigated thin oxide films.

Course
Other identifiers
Book Title
Keywords
Dynamical X-ray photoelectron spectroscopy, Electrochemical deposition, Mixed oxide surfaces
Citation
Published Version (Please cite this version)