Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders
buir.contributor.author | Özbay, Ekmel | |
buir.contributor.author | Turhan, Adil Burak | |
buir.contributor.orcid | Özbay, Ekmel|0000-0003-2953-1828 | |
dc.citation.epage | 2552 | en_US |
dc.citation.issueNumber | 10 | en_US |
dc.citation.spage | 2545 | en_US |
dc.citation.volumeNumber | 57 | en_US |
dc.contributor.author | Işıl, Ç. | en_US |
dc.contributor.author | Yorulmaz, M. | en_US |
dc.contributor.author | Solmaz, B. | en_US |
dc.contributor.author | Turhan, Adil Burak | en_US |
dc.contributor.author | Yurdakul, C. | en_US |
dc.contributor.author | Ünlü, S. | en_US |
dc.contributor.author | Özbay, Ekmel | en_US |
dc.contributor.author | Koç, A. | en_US |
dc.date.accessioned | 2019-02-21T16:07:39Z | |
dc.date.available | 2019-02-21T16:07:39Z | |
dc.date.issued | 2018 | en_US |
dc.department | Nanotechnology Research Center (NANOTAM) | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | Wide-field interferometric microscopy is a highly sensitive, label-free, and low-cost biosensing imaging technique capable of visualizing individual biological nanoparticles such as viral pathogens and exosomes. However, further resolution enhancement is necessary to increase detection and classification accuracy of subdiffraction-limited nanoparticles. In this study, we propose a deep-learning approach, based on coupled deep autoencoders, to improve resolution of images of L-shaped nanostructures. During training, our method utilizes microscope image patches and their corresponding manual truth image patches in order to learn the transformation between them. Following training, the designed network reconstructs denoised and resolution-enhanced image patches for unseen input. | |
dc.description.provenance | Made available in DSpace on 2019-02-21T16:07:39Z (GMT). No. of bitstreams: 1 Bilkent-research-paper.pdf: 222869 bytes, checksum: 842af2b9bd649e7f548593affdbafbb3 (MD5) Previous issue date: 2018 | en |
dc.identifier.doi | 10.1364/AO.57.002545 | |
dc.identifier.issn | 1559-128X | |
dc.identifier.uri | http://hdl.handle.net/11693/50375 | |
dc.language.iso | English | |
dc.publisher | OSA - The Optical Society | |
dc.relation.isversionof | https://doi.org/10.1364/AO.57.002545 | |
dc.source.title | Applied Optics | en_US |
dc.title | Resolution enhancement of wide-field interferometric microscopy by coupled deep autoencoders | en_US |
dc.type | Article | en_US |
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