Scanning Hall probe microscopy (SHPM) using quartz crystal AFM feedback

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dc.citation.epage622en_US
dc.citation.issueNumber2en_US
dc.citation.spage619en_US
dc.citation.volumeNumber8en_US
dc.contributor.authorDede, Müniren_US
dc.contributor.authorÜrkmen, Korayen_US
dc.contributor.authorGirişen, Ö.en_US
dc.contributor.authorAtabak, Mehrdaden_US
dc.contributor.authorOral, Ahmeten_US
dc.contributor.authorFarrer, I.en_US
dc.contributor.authorRitchie, D.en_US
dc.coverage.spatialBaltimore, MD, USAen_US
dc.date.accessioned2016-02-08T11:38:57Zen_US
dc.date.available2016-02-08T11:38:57Zen_US
dc.date.issued2007en_US
dc.departmentDepartment of Physicsen_US
dc.descriptionDate of Conference: 13–17 March 2006en_US
dc.descriptionConference Name: 2006 APS March Meetingen_US
dc.description.abstractScanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of ∼50 nm and 7 mG/Hz 1/2 at room temperature. In the SHPM technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is used to keep the Hall sensor in close proximity of the sample surface. However, STM tracking SHPM requires conductive samples; therefore the insulating substrates have to be coated with a thin layer of gold. This constraint can be eliminated with the AFM feedback using sophisticated Hall probes that are integrated with AFM cantilevers. However it is very difficult to micro fabricate these sensors. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The Hall sensor chip is simply glued at the end of a 32.768 kHz or 100 kHz Quartz crystal, which is used as force sensor. An LT-SHPM system is used to scan the samples. The sensor assembly is dithered at the resonance frequency using a digital Phase Locked Loop circuit and frequency shifts are used for AFM tracking. SHPM electronics is modified to detect AFM topography and the frequency shift, along with the magnetic field image. Magnetic domains and topography of an Iron Garnet thin film crystal, NdFeB demagnetised magnet and hard disk samples are presented at room temperature. The performance is found to be comparable with the SHPM using STM feedback.en_US
dc.identifier.doi10.1166/jnn.2008.A265en_US
dc.identifier.issn1533-4880en_US
dc.identifier.urihttp://hdl.handle.net/11693/26898en_US
dc.language.isoEnglishen_US
dc.publisherAmerican Scientific Publishersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1166/jnn.2008.A265en_US
dc.source.titleJournal of Nanoscience and Nanotechnologyen_US
dc.subjectAFMen_US
dc.subjectQuartz crystalen_US
dc.subjectScanning hall probe microscopyen_US
dc.subjectHall sensorsen_US
dc.subjectMagnetic field resolutionen_US
dc.subjectAtomic force microscopyen_US
dc.subjectConductive materialsen_US
dc.subjectMagnetic fieldsen_US
dc.subjectMagnetic sensorsen_US
dc.subjectScanning tunneling microscopyen_US
dc.titleScanning Hall probe microscopy (SHPM) using quartz crystal AFM feedbacken_US
dc.typeConference Paperen_US

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