An investigation of fidelity regions in the dual-pulse 𝝓-OTDR systems

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buir.contributor.authorYıldız, Muhammed Kaan
buir.contributor.authorUyar, Faruk
buir.contributor.authorKartaloǧlu, Tolga
buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidYıldız, Muhammed Kaan|0000-0002-0833-1192
buir.contributor.orcidUyar, Faruk|0000-0003-3552-1650
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
buir.contributor.orcidKartaloǧlu, Tolga|0000-0001-5299-1705
dc.contributor.authorYıldız, Muhammed Kaan
dc.contributor.authorUyar, Faruk
dc.contributor.authorKartaloǧlu, Tolga
dc.contributor.authorOzdur, İ. T.
dc.contributor.authorÖzbay, Ekmel
dc.coverage.spatialWashington DC, United Statesen_US
dc.date.accessioned2022-02-24T05:23:47Z
dc.date.available2022-02-24T05:23:47Z
dc.date.issued2021
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentDepartment of Physicsen_US
dc.departmentNanotechnology Research Center (NANOTAM)en_US
dc.descriptionConference Name: OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES)en_US
dc.descriptionDate of Conference: 19–23 July 2021en_US
dc.description.abstractThe dual-pulse interrogation enables the phase extraction from the intensity of the backreflection signal in 𝜙-OTDR systems. We investigate the high and low fidelity regions in the back-reflected signal by analyzing the system response to external disturbances.en_US
dc.identifier.doi10.1364/SENSORS.2021.SM5A.4en_US
dc.identifier.isbn978-155752820-9
dc.identifier.urihttp://hdl.handle.net/11693/77590
dc.publisherThe Optical Societyen_US
dc.relation.isversionofhttps://doi.org/10.1364/SENSORS.2021.SM5A.4en_US
dc.source.titleOptical Sensors 2021en_US
dc.titleAn investigation of fidelity regions in the dual-pulse 𝝓-OTDR systemsen_US
dc.typeConference Paperen_US

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