Geometric random inner product test and randomness of π

dc.citation.epage311en_US
dc.citation.issueNumber2en_US
dc.citation.spage295en_US
dc.citation.volumeNumber20en_US
dc.contributor.authorSezgin, F.en_US
dc.date.accessioned2016-02-08T10:05:26Z
dc.date.available2016-02-08T10:05:26Z
dc.date.issued2009en_US
dc.departmentBusiness Information Managementen_US
dc.description.abstractThe Geometric Random Inner Product (GRIP) is a recently developed test method for randomness. As a relatively new method, its properties, weaknesses, and strengths are not well documented. In this paper, we provide a rigorous discussion of what the GRIP test measures, and point out specific classes of defects that it is able to diagnose. Our findings show that the GRIP test successfully detects series that have regularities in their first- or second-order differences, such as the Weyl and nested Weyl sequences. We compare and contrast the GRIP test to some of the existing conventional methods and show that it is particularly successful in diagnosing deficient random number generators with bad lattice structures and short periods. We also present an application of the GRIP test to the decimal digits of π.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:05:26Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2009en
dc.identifier.doi10.1142/S0129183109013625en_US
dc.identifier.eissn1793-6586
dc.identifier.issn0129-1831
dc.identifier.urihttp://hdl.handle.net/11693/22842
dc.language.isoEnglishen_US
dc.publisherWorld Scientific Publishing Co. Pte. Ltd.en_US
dc.relation.isversionofhttp://dx.doi.org/10.1142/S0129183109013625en_US
dc.source.titleInternational Journal of Modern Physics Cen_US
dc.subjectGeometric random inner productsen_US
dc.subjectPseudorandomen_US
dc.subjectRandom number generatoren_US
dc.subjectRandomness of πen_US
dc.subjectRandomness testingen_US
dc.subjectMonte Carloen_US
dc.titleGeometric random inner product test and randomness of πen_US
dc.typeArticleen_US

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