Application of signal-processing techniques to reduce the errors related to the FDTD excitations

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buir.contributor.authorGürel, Levent
dc.citation.epage153en_US
dc.citation.spage150en_US
dc.contributor.authorGürel, Leventen_US
dc.contributor.authorOğuz, Uğuren_US
dc.coverage.spatialBoston, MA, USAen_US
dc.date.accessioned2016-02-08T11:57:31Z
dc.date.available2016-02-08T11:57:31Z
dc.date.issued2001en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 8-13 July 2001en_US
dc.descriptionConference Name: Antennas and Propagation Society International Symposium, IEEE 2001en_US
dc.description.abstractA study on the reduction of the errors related to the finite-difference time-domain (FDTD) excitations was performed by employing signal-processing techniques. Plane-wave scattering problems were simulated. The improvements in both plane-wave and finite-source excitation schemes were demonstrated. The result showed that a visible DC offset value was exhibited even after five periods of the incident wave.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:57:31Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2001en
dc.identifier.doi10.1109/APS.2001.959421en_US
dc.identifier.issn1522-3965
dc.identifier.urihttp://hdl.handle.net/11693/27603
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttps://doi.org/10.1109/APS.2001.959421en_US
dc.source.titleProceedings of the Antennas and Propagation Society International Symposium, IEEE 2001en_US
dc.subjectComputer simulationen_US
dc.subjectElectromagnetic wave scatteringen_US
dc.subjectError analysisen_US
dc.subjectFinite difference methoden_US
dc.subjectSamplingen_US
dc.subjectSignal processingen_US
dc.subjectTime domain analysisen_US
dc.subjectPlane-wave scatteringen_US
dc.subjectElectromagnetic wavesen_US
dc.titleApplication of signal-processing techniques to reduce the errors related to the FDTD excitationsen_US
dc.typeConference Paperen_US

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