Charging / discharging of thin PS / PMMA films as probed by dynamic x-ray photoelectron spectroscopy
Date
2007
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Source Title
Macromolecules
Print ISSN
0024-9297
Electronic ISSN
Publisher
Volume
40
Issue
12
Pages
4109 - 4112
Language
English
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Volume Title
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Abstract
Polystyrene / polymethyl methacrylate (PS-PMMA) thin films were analyzed for detecting phase separation as well as probing their electrical responses by XPS. It was also shown that electrical parameters like resistance or capacitance can also be extracted using dynamical XPS measurements. A Kratos ES300 electron spectrometer was used for XPS measurements, and a nearby filament provided low-energy electrons for charge neutralization. The results show that under a positive stress, low-energy electrons are attracted to the sample and yield less positive charge on the sample, due to partial neutralization.