Simulations of switching vibrating cantilever in atomic force microscopy

buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage96en_US
dc.citation.issueNumber4-Janen_US
dc.citation.spage86en_US
dc.citation.volumeNumber205en_US
dc.contributor.authorBalantekin, M.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2015-07-28T11:57:17Z
dc.date.available2015-07-28T11:57:17Z
dc.date.issued2003-01-31en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractWe analyze the steady state tip sample interaction in atomic force microscopy by using an electrical circuit simulator. The phase shift between the cantilever excitation and tip, and the amplitude versus distance curves are obtained with sample stiffness as a parameter. The height shifts and hysteresis in amplitude and phase curves are observed as a result of the influence of the force between the tip and the sample. The damping and switching mechanisms are explained using the force traces obtained from simulations. The oscillation amplitude dependence of operating mode is inspected. We find that improper selection of the free tip oscillation amplitude is the cause of operating state transitions. (C) 2002 Elsevier Science B.V. All rights reserved.en_US
dc.description.provenanceMade available in DSpace on 2015-07-28T11:57:17Z (GMT). No. of bitstreams: 1 10.1016-S0169-4332(02)01083-8.pdf: 267351 bytes, checksum: 35f45800774f6ad9e226e45866ec005f (MD5)en
dc.identifier.doi10.1016/S0169-4332(02)01083-8en_US
dc.identifier.issn0169-4332
dc.identifier.urihttp://hdl.handle.net/11693/11261
dc.language.isoEnglishen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/S0169-4332(02)01083-8en_US
dc.source.titleApplied Surface Scienceen_US
dc.subjectTip oscillationsen_US
dc.subjectSwitchingen_US
dc.subjectDampingen_US
dc.subjectHysterisisen_US
dc.titleSimulations of switching vibrating cantilever in atomic force microscopyen_US
dc.typeArticleen_US

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