Unsupervised anomaly detection via deep metric learning with end-to-end optimization

buir.advisorKozat, Süleyman Serdar
dc.contributor.authorYılmaz, Selim Fırat
dc.date.accessioned2021-08-04T05:24:01Z
dc.date.available2021-08-04T05:24:01Z
dc.date.copyright2021-07
dc.date.issued2021-07
dc.date.submitted2021-07-30
dc.descriptionCataloged from PDF version of article.en_US
dc.descriptionThesis (Master's): Bilkent University, Department of Electrical and Electronics Engineering, İhsan Doğramacı Bilkent University, 2021.en_US
dc.descriptionIncludes bibliographical references (leaves 46-52).en_US
dc.description.abstractWe investigate unsupervised anomaly detection for high-dimensional data and introduce a deep metric learning (DML) based framework. In particular, we learn a distance metric through a deep neural network. Through this metric, we project the data into the metric space that better separates the anomalies from the normal data and reduces the effect of the curse of dimensionality for high-dimensional data. We present a novel data distillation method through self-supervision to remedy the conventional practice of assuming all data as normal. We also employ the hard mining technique from the DML literature. We show these components improve the performance of our model. Through an extensive set of experiments on the 14 real-world datasets, our method demonstrates significant performance gains compared to the state-of-the-art unsupervised anomaly detection methods, e.g., an absolute improvement between 4.44% and 11.74% on the average over the 14 datasets. Furthermore, we share the source code of our method on Github to facilitate further research.en_US
dc.description.provenanceSubmitted by Betül Özen (ozen@bilkent.edu.tr) on 2021-08-04T05:24:01Z No. of bitstreams: 1 10407238.pdf: 1200904 bytes, checksum: e435db9963781e10cc3601929364ec17 (MD5)en
dc.description.provenanceMade available in DSpace on 2021-08-04T05:24:01Z (GMT). No. of bitstreams: 1 10407238.pdf: 1200904 bytes, checksum: e435db9963781e10cc3601929364ec17 (MD5) Previous issue date: 2021-07en
dc.description.statementofresponsibilityby Selim Fırat Yılmazen_US
dc.format.extentix, 52 leaves : charts ; 30 cm.en_US
dc.identifier.itemidB157322
dc.identifier.urihttp://hdl.handle.net/11693/76402
dc.language.isoEnglishen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAnomaly detectionen_US
dc.subjectUnsuperviseden_US
dc.subjectOne-classen_US
dc.subjectDeep metric learningen_US
dc.subjectData distillationen_US
dc.titleUnsupervised anomaly detection via deep metric learning with end-to-end optimizationen_US
dc.title.alternativeDerin metrik öğrenmesi ile baştan sona optimize edilebilen gözetimsiz anomali tespitien_US
dc.typeThesisen_US
thesis.degree.disciplineElectrical and Electronic Engineering
thesis.degree.grantorBilkent University
thesis.degree.levelMaster's
thesis.degree.nameMS (Master of Science)

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